{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:21:36Z","timestamp":1740133296179,"version":"3.37.3"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2022,1]]},"DOI":"10.1109\/tvlsi.2021.3109824","type":"journal-article","created":{"date-parts":[[2021,9,15]],"date-time":"2021-09-15T20:11:12Z","timestamp":1631736672000},"page":"81-94","source":"Crossref","is-referenced-by-count":2,"title":["Timing Variability-Aware Analysis and Optimization for Variable-Latency Designs"],"prefix":"10.1109","volume":"30","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4663-9099","authenticated-orcid":false,"given":"Ning-Chi","family":"Huang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chao-Wei","family":"Cheng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kai-Chiang","family":"Wu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7927174"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/43.700720"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/12.795120"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/1278480.1278721"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090937"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2058874"},{"volume-title":"International Technology Roadmap for Semiconductors (ITRS)","year":"2013","author":"Wilson","key":"ref7"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/1278480.1278582"},{"key":"ref9","first-page":"176","article-title":"Reliability challenges for 45 nm and beyond","volume-title":"Proc. DAC","author":"McPherson"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2008.4672007"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403679"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2311300"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2026280"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2012.6165059"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2265662"},{"volume-title":"Logical Effort: Designing Fast CMOS Circuits","year":"1999","author":"Sutherland","key":"ref16"},{"key":"ref17","first-page":"90","article-title":"Recent advances in particle swarm","volume-title":"Proc. IEEE Congr. Evol. Comput.","author":"Hu"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAIE.2011.6162105"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2035575"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/996566.996695"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2016.7483873"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2008810"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2007.4397353"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/9686552\/09537921.pdf?arnumber=9537921","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T22:51:24Z","timestamp":1705013484000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9537921\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,1]]},"references-count":23,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2021.3109824","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"type":"print","value":"1063-8210"},{"type":"electronic","value":"1557-9999"}],"subject":[],"published":{"date-parts":[[2022,1]]}}}