{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,13]],"date-time":"2026-06-13T17:13:15Z","timestamp":1781370795578,"version":"3.54.1"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2021,12,1]],"date-time":"2021-12-01T00:00:00Z","timestamp":1638316800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,12,1]],"date-time":"2021-12-01T00:00:00Z","timestamp":1638316800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,12,1]],"date-time":"2021-12-01T00:00:00Z","timestamp":1638316800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004663","name":"Ministry of Science and Technology, Taiwan","doi-asserted-by":"publisher","award":["MOST 108-2218-E-110-002"],"award-info":[{"award-number":["MOST 108-2218-E-110-002"]}],"id":[{"id":"10.13039\/501100004663","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004663","name":"Ministry of Science and Technology, Taiwan","doi-asserted-by":"publisher","award":["MOST 109-2218-E-110-007"],"award-info":[{"award-number":["MOST 109-2218-E-110-007"]}],"id":[{"id":"10.13039\/501100004663","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2021,12]]},"DOI":"10.1109\/tvlsi.2021.3115970","type":"journal-article","created":{"date-parts":[[2021,10,14]],"date-time":"2021-10-14T01:51:34Z","timestamp":1634176294000},"page":"2172-2185","source":"Crossref","is-referenced-by-count":13,"title":["A 40-nm CMOS Multifunctional Computing-in-Memory (CIM) Using Single-Ended Disturb-Free 7T 1-Kb SRAM"],"prefix":"10.1109","volume":"29","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2426-2879","authenticated-orcid":false,"given":"Chua-Chin","family":"Wang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8014-8229","authenticated-orcid":false,"given":"Lean Karlo S.","family":"Tolentino","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Chia-Yi","family":"Huang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2837-6662","authenticated-orcid":false,"given":"Chia-Hung","family":"Yeh","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ITCE.2018.8316623"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2015.7338360"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2885536"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2661838"},{"key":"ref14","first-page":"578","article-title":"Photovoltaic cell defect detection model based-on extracted electroluminescence images using SVM classifier","author":"juan","year":"2020","journal-title":"Proc Int Conf Artif Intell Inf Commun (ICAIIC)"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/HNICEM48295.2019.9072907"},{"key":"ref16","first-page":"119","article-title":"Alphanumeric test paper checker through intelligent character recognition using openCV and support vector machine","author":"velasco","year":"2018","journal-title":"Proc World Congr Eng Technol Innov Sustainability"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2778702"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2871623"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10030300"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2848999"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2016.7841256"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2776309"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2006.888767"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.833669"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-15-1289-6_5"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISOCC.2016.7799754"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2776954"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2002.801578"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/359576.359579"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2664069"},{"key":"ref22","first-page":"72","article-title":"A 40-nm 0.5-V 20.1-$\\mu\\text{W}$\n\/MHz 8 T SRAM with low-energy disturb mitigation scheme","author":"yoshimoto","year":"2011","journal-title":"Symp VLSI Circuits Dig Tech Papers"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2010.2071690"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2012.6187538"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2012.2198984"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2014.2336531"},{"key":"ref25","first-page":"337","article-title":"A 300 mV sub-1 pJ differential 6 T sub-threshold SRAM with low energy and variability resilient local assist circuit","author":"chiou","year":"2013","journal-title":"Proc Int Symp Next-Gener Electron"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/9627316\/09569951.pdf?arnumber=9569951","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:50:20Z","timestamp":1652194220000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9569951\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,12]]},"references-count":27,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2021.3115970","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,12]]}}}