{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T09:44:35Z","timestamp":1762508675267,"version":"3.37.3"},"reference-count":47,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2022,2,1]],"date-time":"2022-02-01T00:00:00Z","timestamp":1643673600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,2,1]],"date-time":"2022-02-01T00:00:00Z","timestamp":1643673600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,2,1]],"date-time":"2022-02-01T00:00:00Z","timestamp":1643673600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003621","name":"Korea Government","doi-asserted-by":"publisher","award":["2021R1A6A3A14040197"],"award-info":[{"award-number":["2021R1A6A3A14040197"]}],"id":[{"id":"10.13039\/501100003621","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2022,2]]},"DOI":"10.1109\/tvlsi.2021.3131170","type":"journal-article","created":{"date-parts":[[2021,12,10]],"date-time":"2021-12-10T20:39:10Z","timestamp":1639168750000},"page":"143-152","source":"Crossref","is-referenced-by-count":9,"title":["Low-Noise Distributed <i>RC<\/i> Oscillator"],"prefix":"10.1109","volume":"30","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2951-9522","authenticated-orcid":false,"given":"Jahyun","family":"Koo","sequence":"first","affiliation":[{"name":"Electrical and Computer Engineering Department, University of California, Santa Barbara (UCSB), Santa Barbara, CA, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1814-6211","authenticated-orcid":false,"given":"Jae-Yoon","family":"Sim","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, Pohang University of Science and Technology (POSTECH), Pohang, South Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2048732"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2013.6487693"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2010.5560332"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870277"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2906359"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310180"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2869083"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9366021"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365795"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9063029"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/16.925245"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7417929"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.2987681"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1983.1052034"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.1004574"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2877927"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9062942"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-2602-2_16"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2008.4523200"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2012.6243767"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2014.6946008"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2559508"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2403369"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757443"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870278"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2016.2581825"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.843591"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2013.2281920"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2331110"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2586178"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7417927"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2008.2002547"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.876206"},{"issue":"1","key":"ref34","first-page":"82","article-title":"Calculate oscillator jitter by using phase-noise analysis","volume":"40","author":"Drakhlis","year":"2001","journal-title":"Microw. RF"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2009.4977478"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2012.6243766"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2021914"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/16.333824"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7062948"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870276"},{"key":"ref41","first-page":"226","article-title":"A 10MHz $80~\\mu\\text{W}$\n 67ppm\/\u00b0C CMOS reference clock oscillator with a temperature compensated feedback loop in $0.18~\\mu\\text{m}$\n CMOS","volume-title":"Dig. Symp. VLSI Circuits","author":"Lee"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2012.2226500"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2824307"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2018.8357093"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-DAT.2017.7939665"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2948032"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/VLSICircuits18222.2020.9162838"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/9705196\/09646480.pdf?arnumber=9646480","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T21:13:24Z","timestamp":1709327604000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9646480\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,2]]},"references-count":47,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2021.3131170","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"type":"print","value":"1063-8210"},{"type":"electronic","value":"1557-9999"}],"subject":[],"published":{"date-parts":[[2022,2]]}}}