{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,23]],"date-time":"2025-12-23T10:42:01Z","timestamp":1766486521515,"version":"3.37.3"},"reference-count":43,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001843","name":"Department of Science and Technology (DST), Government of India","doi-asserted-by":"publisher","award":["ECR\/2018\/002836"],"award-info":[{"award-number":["ECR\/2018\/002836"]}],"id":[{"id":"10.13039\/501100001843","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2022,9]]},"DOI":"10.1109\/tvlsi.2022.3178735","type":"journal-article","created":{"date-parts":[[2022,6,8]],"date-time":"2022-06-08T19:33:07Z","timestamp":1654716787000},"page":"1281-1293","source":"Crossref","is-referenced-by-count":26,"title":["A 0.3 nW, 0.093%\/V Line Sensitivity, Temperature Compensated Bulk-Programmable Voltage Reference for Wireless Sensor Nodes"],"prefix":"10.1109","volume":"30","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1266-0589","authenticated-orcid":false,"given":"Indranil","family":"Bhattacharjee","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, IIT Hyderabad, Sangareddy, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8412-4187","authenticated-orcid":false,"given":"Gajendranath","family":"Chowdary","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, IIT Hyderabad, Sangareddy, India"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2325574"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2015.2417095"},{"issue":"3Q","key":"ref4","first-page":"5","article-title":"How the voltage reference affects ADC performance. Part 2","author":"Oljaca","year":"2009","journal-title":"Analog Appl."},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2857821"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3044165"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2018.8579316"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7062945"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2020.3005758"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2836331"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2206683"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2016.7573494"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2017.2654441"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2018.8494332"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2018.2794512"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/CICC51472.2021.9431577"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2963566"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2018.2809578"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2015.2502169"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2501982"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.820882"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2654326"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2092997"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2017.8240267"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3081440"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2011.2177703"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICRITO.2015.7359345"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.881549"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS45731.2020.9180858"},{"volume-title":"Operation and Modeling of the MOS Transistor","year":"2004","author":"Tsividis","key":"ref30"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1017\/cbo9781139195065"},{"key":"ref32","volume-title":"Solid State Electronic Devices","volume":"10","author":"Streetman","year":"2006"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/16.19963"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2006.877306"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1986.22737"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/22.363006"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/IEEE-IWS.2013.6616827"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2018.2867678"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2946680"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/MMM.2014.2355954"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2942356"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2908284"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3028506"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2754644"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/9874436\/09791454.pdf?arnumber=9791454","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T03:01:31Z","timestamp":1706756491000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9791454\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9]]},"references-count":43,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2022.3178735","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"type":"print","value":"1063-8210"},{"type":"electronic","value":"1557-9999"}],"subject":[],"published":{"date-parts":[[2022,9]]}}}