{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T12:41:21Z","timestamp":1780317681464,"version":"3.54.1"},"reference-count":63,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000006","name":"Office of Naval Research","doi-asserted-by":"publisher","award":["N00014-19-1-2287"],"award-info":[{"award-number":["N00014-19-1-2287"]}],"id":[{"id":"10.13039\/100000006","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2022,9]]},"DOI":"10.1109\/tvlsi.2022.3190236","type":"journal-article","created":{"date-parts":[[2022,7,19]],"date-time":"2022-07-19T19:30:02Z","timestamp":1658259002000},"page":"1244-1255","source":"Crossref","is-referenced-by-count":12,"title":["Detection of Recycled ICs Using Backscattering Side-Channel Analysis"],"prefix":"10.1109","volume":"30","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9539-3684","authenticated-orcid":false,"given":"Frank T.","family":"Werner","sequence":"first","affiliation":[{"name":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5955-277X","authenticated-orcid":false,"given":"Milos","family":"Prvulovic","sequence":"additional","affiliation":[{"name":"School of Computer Science, Georgia Institute of Technology, Atlanta, GA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1158-3785","authenticated-orcid":false,"given":"Alenka","family":"Zajic","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.237"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MSPEC.2006.1628506"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2332291"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2012.6378192"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CADS.2017.8310673"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-11824-6"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2409267"},{"key":"ref8","first-page":"455","article-title":"Learning assisted side channel delay test for detection of recycled ICs","volume-title":"Proc. 26th Asia South Pacific Design Autom. Conf.","author":"Vakil"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.3023684"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2021.3115247"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2593157"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2011.66"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2013.6645596"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2015.7116292"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2018.8383917"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2014.6962099"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2016.7805854"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2933278"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2015.7372562"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2011.12.008"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2012.6339194"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147172"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2008.915629"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2599854"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2006.1705198"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2009.2016954"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/1723112.1723152"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2011.6132704"},{"key":"ref29","first-page":"29","article-title":"The EM side\u2014Channel (s)","volume-title":"Proc. Int. Workshop Cryptograph. Hardw. Embedded Syst.","author":"Agrawal"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-44709-1_21"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48405-1_25"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48059-5_14"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-08302-5_15"},{"key":"ref34","first-page":"307","article-title":"Acoustic side-channel attacks on printers","volume-title":"Proc. USENIX Secur. Symp.","author":"Backes"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-68697-5_9"},{"key":"ref36","first-page":"585","article-title":"One&done: A single-decryption EM-based attack on OpenSSL\u2019s constant-time blinded RSA","volume-title":"Proc. 27th USENIX Secur. Symp. (USENIX Security)","author":"Alam"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/0167-4048(85)90046-X"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1007\/springerreference_177"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1007\/s13389-015-0100-7"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1145\/3079856.3080223"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2019.2945767"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1007\/s41635-019-00074-w"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2020.3016892"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1007\/s41635-020-00093-y"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2007.36"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2017.2750078"},{"key":"ref47","first-page":"1","article-title":"Side-channel attacks: Ten years after its publication and the impacts on cryptographic module security testing","author":"Zhou","year":"2005","journal-title":"Cryptol. ePrint Arch."},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1007\/s41635-021-00112-6"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2906547"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/JRFID.2019.2894508"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1002\/0471758159"},{"key":"ref52","volume-title":"Predictive Technology Model (PTM)","year":"2011"},{"key":"ref53","volume-title":"DE0-CV Board","year":"2022"},{"key":"ref54","volume-title":"A review of TSMC 28 nm process technology. TechInsights","author":"Dixon-Warren","year":"2022"},{"key":"ref55","volume-title":"EM Probe Station","year":"2022"},{"key":"ref56","volume-title":"X-LSQ Series: High-Speed Motorized Linear Stages With Built-in Controllers","year":"2022"},{"key":"ref57","volume-title":"RF & Near-Field Probes","year":"2022"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/IRWS.2000.911909"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2013.6657085"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1007\/s41635-017-0001-6"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2005.04.008"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1109\/HOST45689.2020.9300127"},{"key":"ref63","volume-title":"New side-channel and techniques for hardware trojan detection","author":"Nguyen","year":"2020"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/9874436\/09833463.pdf?arnumber=9833463","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T06:27:29Z","timestamp":1706768849000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9833463\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9]]},"references-count":63,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2022.3190236","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,9]]}}}