{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,11]],"date-time":"2026-04-11T13:15:46Z","timestamp":1775913346985,"version":"3.50.1"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100005057","name":"Taiwan Semiconductor Research Institute (TSRI) for chip fabrication","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100005057","id-type":"DOI","asserted-by":"publisher"}]},{"name":"University of Defence, Brno, through the Organization Development Project VAROPS"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2022,11]]},"DOI":"10.1109\/tvlsi.2022.3203148","type":"journal-article","created":{"date-parts":[[2022,9,19]],"date-time":"2022-09-19T20:08:56Z","timestamp":1663618136000},"page":"1739-1747","source":"Crossref","is-referenced-by-count":48,"title":["A 0.5-V Multiple-Input Bulk-Driven OTA in 0.18-\u03bcm CMOS"],"prefix":"10.1109","volume":"30","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9864-9830","authenticated-orcid":false,"given":"Fabian","family":"Khateb","sequence":"first","affiliation":[{"name":"Department of Microelectronics, Brno University of Technology, Brno, Czech Republic"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6315-9292","authenticated-orcid":false,"given":"Tomasz","family":"Kulej","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Częstochowa University of Technology, Częstochowa, Poland"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4251-1138","authenticated-orcid":false,"given":"Meysam","family":"Akbari","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, University of Kurdistan, Sanandaj, Iran"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9689-1236","authenticated-orcid":false,"given":"Kea-Tiong","family":"Tang","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2021.3090983"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2022.3144095"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s00034-018-0901-x"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3390\/s20113303"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/s19235173"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-014-0385-y"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-011-9618-5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2020.2968246"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.920333"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2021.3084695"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2019.2935172"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2017.2741343"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/el:19920135"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/4.62164"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/access.2022.3147665"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/access.2021.3060939"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/access.2021.3098183"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s00034-018-0999-x"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.aeue.2018.12.023"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.aeue.2021.154098"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/4.315"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1049\/el:19950376"},{"key":"ref23","volume-title":"Operation and Modeling of the MOS Transistor","author":"Tsividis","year":"2010"},{"issue":"2","key":"ref24","first-page":"21","article-title":"Simple op amp measurements","volume":"45","author":"Bryant","year":"2011","journal-title":"Analog Dialogue"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/9925603\/09894730.pdf?arnumber=9894730","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,24]],"date-time":"2024-01-24T02:11:08Z","timestamp":1706062268000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9894730\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,11]]},"references-count":24,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2022.3203148","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,11]]}}}