{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,23]],"date-time":"2025-05-23T04:49:12Z","timestamp":1747975752565,"version":"3.37.3"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"NSF","doi-asserted-by":"publisher","award":["2117349"],"award-info":[{"award-number":["2117349"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100010185","name":"U.S. Government between Aviation & Missiles Technology Consortium (AMTC) and the Government","doi-asserted-by":"publisher","award":["W9124P-18-9-0001"],"award-info":[{"award-number":["W9124P-18-9-0001"]}],"id":[{"id":"10.13039\/100010185","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2023,1]]},"DOI":"10.1109\/tvlsi.2022.3214724","type":"journal-article","created":{"date-parts":[[2022,11,3]],"date-time":"2022-11-03T23:23:49Z","timestamp":1667517829000},"page":"65-78","source":"Crossref","is-referenced-by-count":10,"title":["A Twofold Clock and Voltage-Based Detection Method for Laser Logic State Imaging Attack"],"prefix":"10.1109","volume":"31","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2057-7435","authenticated-orcid":false,"given":"Tasnuva","family":"Farheen","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA"}]},{"given":"Sourav","family":"Roy","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3752-2358","authenticated-orcid":false,"given":"Shahin","family":"Tajik","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Worcester Polytechnic Institute, Worcester, MA, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2794-7320","authenticated-orcid":false,"given":"Domenic","family":"Forte","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-53140-2_8"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3133956.3134039"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/SP40001.2021.00029"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2018.i3.573-595"},{"key":"ref5","first-page":"627","article-title":"Automatic extraction of secrets from the transistor jungle using laser-assisted side-channel attacks","volume-title":"30th USENIX Secur. Symp.","author":"Krachenfels"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48405-1_25"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-71829-3_2"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2017.2729398"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48405-1_26"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-38348-9_9"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.31399\/asm.cp.istfa2014p0065"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA49335.2020.9261000"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/3474376.3487282"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA.2016.7564318"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.31399\/asm.cp.istfa2018p0280"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2017.8046216"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED54688.2022.9806217"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000127"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-33027-8_3"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2018.8383889"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s41635-019-00083-9"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.898074"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA.2018.8452604"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.35848\/1347-4065\/abdf1f"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2019.00032"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2009.5377673"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/MCAS.2004.1371588"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.3390\/s140100129"},{"key":"ref29","first-page":"442","article-title":"Parametric yield estimation considering leakage variability","volume-title":"Proc. 41st Annu. Conf. Design Autom. (DAC)","author":"Rao"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2005.1560034"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2008.916397"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-36400-5_2"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1145\/2508859.2516717"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-0748-5"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2015.2400413"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-44709-3_31"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1049\/iet-ifs:20080038"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2013.19"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1145\/3338508.3359577"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-04138-9_23"},{"key":"ref41","article-title":"Mitigating vulnerabilities of voltage-based intrusion detection systems in controller area networks","volume-title":"arXiv:1907.10783","author":"Sagong","year":"2019"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/92\/9998453\/9930791-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/9998453\/09930791.pdf?arnumber=9930791","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T22:18:10Z","timestamp":1705961890000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9930791\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,1]]},"references-count":41,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2022.3214724","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"type":"print","value":"1063-8210"},{"type":"electronic","value":"1557-9999"}],"subject":[],"published":{"date-parts":[[2023,1]]}}}