{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,27]],"date-time":"2026-06-27T21:46:19Z","timestamp":1782596779482,"version":"3.54.5"},"reference-count":59,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2023,10,1]],"date-time":"2023-10-01T00:00:00Z","timestamp":1696118400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,10,1]],"date-time":"2023-10-01T00:00:00Z","timestamp":1696118400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,1]],"date-time":"2023-10-01T00:00:00Z","timestamp":1696118400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"State Key Laboratory of High Performance Computing Foundation","award":["202201-13"],"award-info":[{"award-number":["202201-13"]}]},{"name":"Science and Technology on Parallel and Distributed Processing Laboratory Foundation","award":["WDZC20205500115"],"award-info":[{"award-number":["WDZC20205500115"]}]},{"name":"National Key Research and Development Project","award":["2021YFB0300300"],"award-info":[{"award-number":["2021YFB0300300"]}]},{"DOI":"10.13039\/501100001809","name":"NSFC","doi-asserted-by":"publisher","award":["62172430"],"award-info":[{"award-number":["62172430"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"NSF of Hunan Province","award":["2021JJ10052"],"award-info":[{"award-number":["2021JJ10052"]}]},{"name":"STIP of Hunan Province","award":["2022RC3065"],"award-info":[{"award-number":["2022RC3065"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2023,10]]},"DOI":"10.1109\/tvlsi.2023.3298327","type":"journal-article","created":{"date-parts":[[2023,8,21]],"date-time":"2023-08-21T18:12:13Z","timestamp":1692641533000},"page":"1578-1591","source":"Crossref","is-referenced-by-count":26,"title":["RHS-TRNG: A Resilient High-Speed True Random Number Generator Based on STT-MTJ Device"],"prefix":"10.1109","volume":"31","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7732-4140","authenticated-orcid":false,"given":"Siqing","family":"Fu","sequence":"first","affiliation":[{"name":"College of Computer Science and Technology, National University of Defense Technology, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tiejun","family":"Li","sequence":"additional","affiliation":[{"name":"College of Computer Science and Technology, National University of Defense Technology, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0944-2708","authenticated-orcid":false,"given":"Chunyuan","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Computer Science and Technology, National University of Defense Technology, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hanqing","family":"Li","sequence":"additional","affiliation":[{"name":"College of Computer Science and Technology, National University of Defense Technology, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1710-4060","authenticated-orcid":false,"given":"Sheng","family":"Ma","sequence":"additional","affiliation":[{"name":"College of Computer Science and Technology, National University of Defense Technology, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jianmin","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Computer Science and Technology, National University of Defense Technology, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ruiyi","family":"Zhang","sequence":"additional","affiliation":[{"name":"Division of Science and Technology, Beijing Normal University-Hong Kong Baptist University United International College, Zhuhai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4439-7436","authenticated-orcid":false,"given":"Lizhou","family":"Wu","sequence":"additional","affiliation":[{"name":"College of Computer Science and Technology, National University of Defense Technology, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ASICON.2017.8252581"},{"key":"ref57","author":"hilpisch","year":"2014","journal-title":"Python or Finance Analyze Big Financial Data"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2012.6187509"},{"key":"ref56","article-title":"Use of the Monte Carlo simulation in valuation of European and American call options","author":"malesevic","year":"2017"},{"key":"ref15","first-page":"236","volume":"5","author":"st\u00f6hr","year":"2006","journal-title":"Magnetism"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevApplied.8.054045"},{"key":"ref14","first-page":"216","article-title":"A true random number generator using time-dependent dielectric breakdown","author":"liu","year":"2011","journal-title":"Symp VLSI Circuits Dig Tech Papers"},{"key":"ref58","author":"sch\u00e4ling","year":"2011","journal-title":"The Boost C++ libraries"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2014.07.019"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/ITC50571.2021.00022"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICEIC51217.2021.9369714"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2372475"},{"key":"ref10","first-page":"144","article-title":"8.2 8 Mb\/s 28 Mb\/mJ robust true-random-number generator in 65 nm CMOS based on differential ring oscillator with feedback resistors","author":"kim","year":"2017","journal-title":"Proc IEEE Int Solid-State Circuits Conf"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.6028\/NIST.SP.800-22r1a"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2020.3034818"},{"key":"ref16","first-page":"123","article-title":"A novel circuit design of true random number generator using magnetic tunnel junction","author":"wang","year":"2016","journal-title":"IEEE\/ACM Int Symp on Nanoscale Arch (NANOARCH)"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2879439"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2927816"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2009.2024325"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS.2015.7182089"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2009.5173239"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA52012.2021.00078"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2200469"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2021.3125228"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2019.2919914"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1063\/1.3637545"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3168133"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1088\/0031-9155\/60\/15\/6097"},{"key":"ref49","first-page":"12.5.1","article-title":"A magnetic tunnel junction based true random number generator with conditional perturb and real-time output probability tracking","author":"choi","year":"2014","journal-title":"IEDM Tech Dig"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1049\/el:20091899"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2017.8053159"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2019.00011"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/SFCS.1982.73"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2897631"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3105915"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.0308"},{"key":"ref40","article-title":"Survey on STT-MRAM testing: Failure mechanisms, fault models, and tests","author":"wu","year":"2020","journal-title":"arXiv 2001 05463"},{"key":"ref35","first-page":"2.3.1","article-title":"Manufacturable 22 nm FD-SOI embedded MRAM technology for industrial-grade MCU and IoT applications","author":"naik","year":"2019","journal-title":"IEDM Tech Dig"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2018.8510623"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19573.2019.8993469"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2004.840847"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2019.2960375"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2015.7409771"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9062955"},{"key":"ref32","first-page":"1","article-title":"Commercialization of 1 Gb standalone spin-transfer torque MRAM","author":"sun","year":"2021","journal-title":"Proc IEEE Int Memory Workshop"},{"key":"ref2","article-title":"The surprising power of graph neural networks with random node initialization","author":"abboud","year":"2020","journal-title":"arXiv 2010 01179"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.future.2017.07.018"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/46\/7\/074001"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/VLSITechnology18217.2020.9265028"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1147\/rd.501.0005"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2224256"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1063\/1.4773180"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1063\/1.3701277"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7927058"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2022.105606"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2018.2873970"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1557\/mrs.2018.93"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.894617"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.63.220403"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/10261320\/10225417.pdf?arnumber=10225417","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,26]],"date-time":"2023-10-26T18:15:15Z","timestamp":1698344115000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10225417\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10]]},"references-count":59,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2023.3298327","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,10]]}}}