{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T02:47:37Z","timestamp":1781837257934,"version":"3.54.5"},"reference-count":96,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2024,7,1]],"date-time":"2024-07-01T00:00:00Z","timestamp":1719792000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,7,1]],"date-time":"2024-07-01T00:00:00Z","timestamp":1719792000000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,7,1]],"date-time":"2024-07-01T00:00:00Z","timestamp":1719792000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,7,1]],"date-time":"2024-07-01T00:00:00Z","timestamp":1719792000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2024,7]]},"DOI":"10.1109\/tvlsi.2024.3384531","type":"journal-article","created":{"date-parts":[[2024,4,12]],"date-time":"2024-04-12T17:35:53Z","timestamp":1712943353000},"page":"1311-1324","source":"Crossref","is-referenced-by-count":16,"title":["FTC: A Universal Framework for Fault-Injection Attack Detection and Prevention"],"prefix":"10.1109","volume":"32","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0928-4508","authenticated-orcid":false,"given":"Md Rafid","family":"Muttaki","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-4605-2865","authenticated-orcid":false,"given":"Md Habibur","family":"Rahman","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Akshay","family":"Kulkarni","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mark","family":"Tehranipoor","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Farimah","family":"Farahmandi","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/2755563"},{"key":"ref2","volume-title":"Introduction to Hardware Security and Trust","author":"Tehranipoor","year":"2011"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-8080-9_7"},{"key":"ref4","first-page":"699","article-title":"VoltPillager: Hardware-based fault injection attacks against Intel SGX enclaves using the SVID voltage scaling interface","volume-title":"Proc. 30th USENIX Secur. Symp.","author":"Chen"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IVSW.2018.8494856"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48405-1_25"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-68697-5_9"},{"key":"ref8","volume-title":"Prevention of side channel attacks against block cipher implementations and other cryptographic systems","author":"Kocher","year":"2010"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2004.1268856"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s13389-011-0022-y"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2016.18"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/3214292.3214302"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2019.00010"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2011.12"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2019.00014"},{"key":"ref16","volume-title":"Voltage glitch detection circuits and methods thereof","author":"Kim","year":"2009"},{"key":"ref17","volume-title":"Voltage-glitch detection device and method for securing integrated circuit device from voltage glitch attack","author":"Kim","year":"2006"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/BLISS.2009.18"},{"issue":"2014","key":"ref19","first-page":"967","article-title":"Faulty clock detection for crypto circuits against differential fault analysis attack","author":"Luo","year":"2016"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2013.6572125"},{"key":"ref21","first-page":"968","article-title":"System clock and power supply cross-checking for glitch detection","author":"Luo","year":"2016"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-44709-3_1"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898065"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2017.7918333"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-49445-6_2"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/s130506713"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3063998"},{"key":"ref28","first-page":"386","article-title":"FTC\u2014A universal low-overhead fault injection attack detection solution","volume-title":"Proc. ISTFA"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/HOST54066.2022.9840177"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2014.2316509"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2013.6604060"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2043591"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/11889700_20"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/AsianHOST.2018.8607175"},{"key":"ref35","first-page":"1","article-title":"Eddy current for magnetic analysis with active sensor","volume-title":"Proc. eSMART","author":"Quisquater"},{"key":"ref36","first-page":"61","article-title":"Optical and EM fault-attacks on CRT-based RSA: Concrete results","volume-title":"Proc. Austrochip","author":"Schmidt"},{"key":"ref37","volume-title":"Semi-invasive attacks\u2014A new approach to hardware security analysis","author":"Skorobogatov","year":"2005"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2010.5560194"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1147\/rd.62.0200"},{"key":"ref40","volume-title":"Fault-Tolerant Systems","author":"Koren","year":"2020"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2008.21"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2004.1347833"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2017.30"},{"key":"ref44","first-page":"1","article-title":"Co-architecting controllers and DRAM to enhance DRAM process scaling","volume-title":"Proc. Memory Forum","volume":"14","author":"Kang"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2017.7870426"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2017.7870427"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1145\/3466752.3480061"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1145\/3422575.3422803"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1007\/s00145-021-09398-9"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2019.8741029"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2021.114155"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3136463"},{"key":"ref53","article-title":"WAGE: An authenticated cipher","author":"AlTawy","year":"2019"},{"key":"ref54","article-title":"Secure lightweight cryptographic hardware constructions for deeply embedded systems","author":"Kaur","year":"2023"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2021.3073163"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-44983-3_4"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/AsianHOST.2016.7835560"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/CCECE.2007.287"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-48800-3_17"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-50011-9_24"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2633412"},{"key":"ref62","first-page":"444","volume-title":"The QARMA block cipher family","author":"Avanzi","year":"2016"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2020.3027789"},{"key":"ref64","first-page":"1702","article-title":"CSI: Rowhammer\u2014Cryptographic security and integrity against rowhammer","volume-title":"Proc. IEEE Symp. SP","author":"Jonas"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-85053-3_8"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2011.11"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1109\/icetect.2011.5760266"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2001.966796"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2021.i2.328-356"},{"key":"ref70","volume-title":"Announcing Four Candidates to be Standardized, Plus Fourth Round Candidates","year":"2022"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.1145\/3603170"},{"key":"ref72","doi-asserted-by":"publisher","DOI":"10.1109\/AsianHOST56390.2022.10022165"},{"key":"ref73","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-10970-7_17"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2881097"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2022.3218614"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2901449"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2952133"},{"key":"ref78","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.804378"},{"key":"ref79","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2031651"},{"key":"ref80","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-45238-6_10"},{"key":"ref81","volume-title":"Vivado\u2014Wikipedia the Free Encyclopedia","year":"2023"},{"key":"ref82","volume-title":"VC Z01X Fault Simulation","year":"2023"},{"key":"ref83","volume-title":"Optimization Problem\u2014Wikipedia the Free Encyclopedia","year":"2023"},{"key":"ref84","volume-title":"Integer Programming\u2014Wikipedia the Free Encyclopedia","year":"2023"},{"key":"ref85","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2018.00049"},{"key":"ref86","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2021.3063306"},{"key":"ref87","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2018.i3.547-572"},{"key":"ref88","volume-title":"E1 Set: Immunity Development System","year":"2015"},{"key":"ref89","volume-title":"Riscure Laser Station 2","year":"2023"},{"key":"ref90","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-31271-2_12"},{"key":"ref91","doi-asserted-by":"publisher","DOI":"10.1007\/s00145-010-9083-9"},{"key":"ref92","volume-title":"RISC-V\u2014Wikipedia the Free Encyclopedia","year":"2023"},{"key":"ref93","volume-title":"Monte Carlo Method\u2014Wikipedia the Free Encyclopedia","year":"2023"},{"key":"ref94","volume-title":"Virtuoso Schematic Editor","year":"2023"},{"key":"ref95","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2015.2491263"},{"key":"ref96","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2006.882218"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/92\/10576042\/10496595-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/10576042\/10496595.pdf?arnumber=10496595","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,29]],"date-time":"2024-06-29T05:12:45Z","timestamp":1719637965000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10496595\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,7]]},"references-count":96,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2024.3384531","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,7]]}}}