{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,26]],"date-time":"2025-12-26T14:27:19Z","timestamp":1766759239040,"version":"3.37.3"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2025,1]]},"DOI":"10.1109\/tvlsi.2024.3435773","type":"journal-article","created":{"date-parts":[[2024,8,6]],"date-time":"2024-08-06T18:20:02Z","timestamp":1722968402000},"page":"293-297","source":"Crossref","is-referenced-by-count":1,"title":["High-Performance Error and Erasure Decoding With Low Complexities Using SPC-RS Concatenated Codes"],"prefix":"10.1109","volume":"33","author":[{"ORCID":"https:\/\/orcid.org\/0009-0006-1410-390X","authenticated-orcid":false,"given":"Zhihao","family":"Zhou","sequence":"first","affiliation":[{"name":"School of Microelectronics, Tianjin University, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2601-3198","authenticated-orcid":false,"given":"Wei","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Tianjin University, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4959-6234","authenticated-orcid":false,"given":"Xinyi","family":"Guo","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Tianjin University, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4948-3520","authenticated-orcid":false,"given":"Jianhan","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Tianjin University, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8488-5480","authenticated-orcid":false,"given":"Yanyan","family":"Liu","sequence":"additional","affiliation":[{"name":"College of Electronic Information and Optical Engineering, Nankai University, Tianjin, China"}]}],"member":"263","reference":[{"volume-title":"Recommendation for Space Data Systems Standard, Telemetry Channel Coding","year":"2017","key":"ref1"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2905966"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/COMST.2016.2618841"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISIT.2006.261907"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/18.412683"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2006.878176"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2021.3097155"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2022.3167989"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2023.3291653"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1049\/iet-com.2016.0371"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2154369"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2023.3266896"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/iet-com.2014.0033"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2019.2912189"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2015.2445759"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2006.882360"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/92\/10818617\/10623603.pdf?arnumber=10623603","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,31]],"date-time":"2024-12-31T06:19:48Z","timestamp":1735625988000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10623603\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,1]]},"references-count":16,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2024.3435773","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"type":"print","value":"1063-8210"},{"type":"electronic","value":"1557-9999"}],"subject":[],"published":{"date-parts":[[2025,1]]}}}