{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,4]],"date-time":"2026-06-04T21:19:59Z","timestamp":1780607999601,"version":"3.54.1"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2024,10,1]],"date-time":"2024-10-01T00:00:00Z","timestamp":1727740800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,10,1]],"date-time":"2024-10-01T00:00:00Z","timestamp":1727740800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,1]],"date-time":"2024-10-01T00:00:00Z","timestamp":1727740800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2018YFA0704400"],"award-info":[{"award-number":["2018YFA0704400"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100008416","name":"Open Project Program of Wuhan National Laboratory for Optoelectronics","doi-asserted-by":"publisher","award":["2021WNLOKF013"],"award-info":[{"award-number":["2021WNLOKF013"]}],"id":[{"id":"10.13039\/501100008416","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2024,10]]},"DOI":"10.1109\/tvlsi.2024.3435974","type":"journal-article","created":{"date-parts":[[2024,8,9]],"date-time":"2024-08-09T17:40:22Z","timestamp":1723225222000},"page":"1812-1821","source":"Crossref","is-referenced-by-count":4,"title":["A 20-V Pulse Driver Based on All-nMOS Charge Pump Without Reversion Loss and Overstress in 65-nm Standard CMOS Technology"],"prefix":"10.1109","volume":"32","author":[{"ORCID":"https:\/\/orcid.org\/0009-0004-9963-1191","authenticated-orcid":false,"given":"Ziliang","family":"Zhou","sequence":"first","affiliation":[{"name":"School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5531-6198","authenticated-orcid":false,"given":"Min","family":"Tan","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3202502"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-022-04415-8"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2551221"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2364975"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7063000"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2008.4796634"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2921653"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.843599"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2327455"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2007.4405757"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2014.7008904"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2020.3019811"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2013.6658533"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2021.3083514"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2636876"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2018.2850341"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3156272"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/esscirc.2003.1257171"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.811991"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2005.1464980"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIR.2005.1541562"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2613080"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2880217"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/92\/10695156\/10633274.pdf?arnumber=10633274","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,27]],"date-time":"2024-09-27T04:37:26Z","timestamp":1727411846000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10633274\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10]]},"references-count":23,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2024.3435974","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,10]]}}}