{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T18:19:55Z","timestamp":1780510795356,"version":"3.54.1"},"reference-count":19,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62174181"],"award-info":[{"award-number":["62174181"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2025,7]]},"DOI":"10.1109\/tvlsi.2025.3546730","type":"journal-article","created":{"date-parts":[[2025,3,18]],"date-time":"2025-03-18T17:48:34Z","timestamp":1742320114000},"page":"2024-2028","source":"Crossref","is-referenced-by-count":2,"title":["A 3.7-nW 248-ppm\/\u00b0C Subthreshold Self-Biased CMOS Current Reference"],"prefix":"10.1109","volume":"33","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5285-4997","authenticated-orcid":false,"given":"Jingjing","family":"Liu","sequence":"first","affiliation":[{"name":"School of Electronics and Communication Engineering, Sun Yat-sen University, Shenzhen, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yuxuan","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Electronics and Communication Engineering, Sun Yat-sen University, Shenzhen, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Weijie","family":"Ge","sequence":"additional","affiliation":[{"name":"School of Electronics and Communication Engineering, Sun Yat-sen University, Shenzhen, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wenji","family":"Mo","sequence":"additional","affiliation":[{"name":"School of Electronics and Communication Engineering, Sun Yat-sen University, Shenzhen, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yuchen","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electronics and Communication Engineering, Sun Yat-sen University, Shenzhen, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-6963-2302","authenticated-orcid":false,"given":"Feng","family":"Yan","sequence":"additional","affiliation":[{"name":"School of Electronics and Communication Engineering, Sun Yat-sen University, Shenzhen, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kangkang","family":"Sun","sequence":"additional","affiliation":[{"name":"School of Electronics and Communication Engineering, Sun Yat-sen University, Shenzhen, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bingjun","family":"Xiong","sequence":"additional","affiliation":[{"name":"School of Electronics and Communication Engineering, Sun Yat-sen University, Shenzhen, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhipeng","family":"Li","sequence":"additional","affiliation":[{"name":"School of Electronics and Communication Engineering, Sun Yat-sen University, Shenzhen, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jian","family":"Guan","sequence":"additional","affiliation":[{"name":"School of Electronics and Communication Engineering, Sun Yat-sen University, Shenzhen, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2014.6894411"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3028506"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2927240"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2018.2881424"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-023-28378-6"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870310"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2015.7338488"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS45731.2020.9180858"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2012.2230592"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS54063.2022.9859347"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-DAT.2019.8741737"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870280"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/iscas48785.2022.9937922"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2092997"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.aeue.2023.154539"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.aeue.2023.154559"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3402960"},{"issue":"8","key":"ref18","first-page":"723","article-title":"A 0.67-\u03bcW 177-ppm\/\u00b0C all-MOS current reference circuit in a 0.18-\u03bcm CMOS technology","volume":"63","author":"Chouhan","year":"2016","journal-title":"IEEE Trans. Circuits Syst. II, Exp. Briefs"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2754644"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/92\/11060007\/10929646.pdf?arnumber=10929646","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T05:38:39Z","timestamp":1751348319000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10929646\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7]]},"references-count":19,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2025.3546730","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,7]]}}}