{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,29]],"date-time":"2026-05-29T10:24:56Z","timestamp":1780050296766,"version":"3.53.1"},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T00:00:00Z","timestamp":1754006400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T00:00:00Z","timestamp":1754006400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T00:00:00Z","timestamp":1754006400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100017622","name":"National Research and Development Program under the National Research Foundation of Korea (NRF) throughKorean Government","doi-asserted-by":"publisher","award":["RS-2024-00339543"],"award-info":[{"award-number":["RS-2024-00339543"]}],"id":[{"id":"10.13039\/501100017622","id-type":"DOI","asserted-by":"publisher"}]},{"name":"ACONIC;"},{"name":"EDA Tool through the IC Design Education Center (IDEC), Daejeon, South Korea."}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2025,8]]},"DOI":"10.1109\/tvlsi.2025.3572883","type":"journal-article","created":{"date-parts":[[2025,5,29]],"date-time":"2025-05-29T13:37:24Z","timestamp":1748525844000},"page":"2349-2353","source":"Crossref","is-referenced-by-count":2,"title":["A Supply Noise-Insensitive Ring DCO With a Self-Biased Shunt Regulator Array in Wide-Range Digital PLL"],"prefix":"10.1109","volume":"33","author":[{"ORCID":"https:\/\/orcid.org\/0009-0009-9539-4287","authenticated-orcid":false,"given":"Kyungmin","family":"Baek","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Columbia University, New York, NY, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-9570-1869","authenticated-orcid":false,"given":"Jiho","family":"Kim","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Hanyang University, Ansan, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kahyun","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Seoul National University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0436-703X","authenticated-orcid":false,"given":"Deog-Kyoon","family":"Jeong","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Seoul National University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8638-6332","authenticated-orcid":false,"given":"Min-Seong","family":"Choo","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Hanyang University, Ansan, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC56115.2022.9980646"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3170887"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2924399"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2579159"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2162912"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3062554"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.862347"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2022916"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2252515"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/cicc.2017.7993677"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2016.7418042"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2769721"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3148174"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIC.2017.8008473"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3123610"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2845859"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373374"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISOCC56007.2022.10031547"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/92\/11096973\/11017684.pdf?arnumber=11017684","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,26]],"date-time":"2025-07-26T06:28:31Z","timestamp":1753511311000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11017684\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,8]]},"references-count":18,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2025.3572883","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,8]]}}}