{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,2]],"date-time":"2026-07-02T05:25:21Z","timestamp":1782969921644,"version":"3.54.5"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100018542","name":"Natural Science Foundation of Sichuan Province","doi-asserted-by":"publisher","award":["2024NSFSC0469"],"award-info":[{"award-number":["2024NSFSC0469"]}],"id":[{"id":"10.13039\/501100018542","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["ZYGX2020ZB001"],"award-info":[{"award-number":["ZYGX2020ZB001"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2025,11]]},"DOI":"10.1109\/tvlsi.2025.3591196","type":"journal-article","created":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T18:18:00Z","timestamp":1754072280000},"page":"3176-3185","source":"Crossref","is-referenced-by-count":2,"title":["Adaptive Confidence Interval-Based Alternate Test for Reliability Enhancement"],"prefix":"10.1109","volume":"33","author":[{"given":"Jiaming","family":"Zhao","sequence":"first","affiliation":[{"name":"University of Electronic Science and Technology of China, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shibo","family":"Chen","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5044-5890","authenticated-orcid":false,"given":"Naixin","family":"Zhou","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5654-4379","authenticated-orcid":false,"given":"Yijiu","family":"Zhao","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4600-734X","authenticated-orcid":false,"given":"Guibing","family":"Zhu","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1023\/b:jett.0000042516.12841.36"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ets48528.2020.9131581"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s00034-021-01652-6"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2024.3495558"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/iscas.2018.8351734"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/43.986428"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2009.2017196"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/vts.2015.7116250"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2017.2739479"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2011.2160376"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2009.2024018"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cds.2019.0191"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/5.0093709"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2019.2948902"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DCIS.2016.7845265"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.23919\/date.2019.8714798"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2023.3244892"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/vlsid.2016.118"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-020-05868-3"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/jmems.2021.3065975"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2007.907232"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2013.12.006"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-021-05934-4"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ets.2018.8400701"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ims3tw.2012.17"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.7873\/date.2014.144"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2025.3530956"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/mdat.2014.2361722"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843837"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/test.2003.1270895"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/bf02481119"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1198\/tech.2001.s49"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1145\/3447755"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/mce.2019.2959075"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/92\/11222394\/11106919.pdf?arnumber=11106919","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,31]],"date-time":"2025-10-31T17:15:17Z","timestamp":1761930917000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11106919\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,11]]},"references-count":34,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2025.3591196","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,11]]}}}