{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,31]],"date-time":"2025-10-31T17:35:11Z","timestamp":1761932111016,"version":"build-2065373602"},"reference-count":14,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2025,11]]},"DOI":"10.1109\/tvlsi.2025.3603557","type":"journal-article","created":{"date-parts":[[2025,9,3]],"date-time":"2025-09-03T17:56:00Z","timestamp":1756922160000},"page":"3201-3205","source":"Crossref","is-referenced-by-count":1,"title":["An Ultralow-Energy Voltage Level Shifter With an Output-Cycle-Based Dynamic Biasing Scheme in a 130-nm CMOS Technology"],"prefix":"10.1109","volume":"33","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-6557-6595","authenticated-orcid":false,"given":"Qun","family":"Zhou","sequence":"first","affiliation":[{"name":"School of Physics and Electronics, Shandong Normal University, Jinan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-4347-0815","authenticated-orcid":false,"given":"Kang","family":"Zeng","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Guangdong University of Technology, Guangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6042-0467","authenticated-orcid":false,"given":"Weiwei","family":"Yue","sequence":"additional","affiliation":[{"name":"School of Physics and Electronics, Shandong Normal University, Jinan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-0175-5059","authenticated-orcid":false,"given":"Qing","family":"Hua","sequence":"additional","affiliation":[{"name":"School of Physics and Electronics, Shandong Normal University, Jinan, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2012.2231037"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/4.661212"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2014.2380691"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2010.2056110"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2020.3033253"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/iscas.2015.7169305"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2023.3237083"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/lssc.2018.2810606"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.2980681"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.2966654"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS.2015.7182025"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2308400"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2010.2043471"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1166\/jolpe.2006.071"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/92\/11222394\/11147156.pdf?arnumber=11147156","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,31]],"date-time":"2025-10-31T17:15:04Z","timestamp":1761930904000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11147156\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,11]]},"references-count":14,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2025.3603557","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"type":"print","value":"1063-8210"},{"type":"electronic","value":"1557-9999"}],"subject":[],"published":{"date-parts":[[2025,11]]}}}