{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,30]],"date-time":"2025-12-30T18:53:17Z","timestamp":1767120797005,"version":"3.48.0"},"reference-count":0,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-009"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-001"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2026,1]]},"DOI":"10.1109\/tvlsi.2025.3637487","type":"journal-article","created":{"date-parts":[[2025,12,29]],"date-time":"2025-12-29T18:40:41Z","timestamp":1767033641000},"page":"1-3","source":"Crossref","is-referenced-by-count":0,"title":["Guest Editorial Special Section on the International Symposium on Circuits and Systems\u2014ISCAS 2025"],"prefix":"10.1109","volume":"34","author":[{"given":"Xinfei","family":"Guo","sequence":"first","affiliation":[{"name":"Global College, Shanghai Jiao Tong University, Shanghai, China"}]},{"given":"Lan-Da","family":"Van","sequence":"additional","affiliation":[{"name":"Department of Computer Science, National Yang Ming Chiao Tung University, Hsinchu, Taiwan"}]},{"given":"Aatmesh","family":"Shrivastava","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Northeastern University, Boston, MA, USA"}]}],"member":"263","container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/92\/11318092\/11318095.pdf?arnumber=11318095","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,30]],"date-time":"2025-12-30T18:40:12Z","timestamp":1767120012000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11318095\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,1]]},"references-count":0,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2025.3637487","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"type":"print","value":"1063-8210"},{"type":"electronic","value":"1557-9999"}],"subject":[],"published":{"date-parts":[[2026,1]]}}}