{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,12]],"date-time":"2026-05-12T06:14:39Z","timestamp":1778566479525,"version":"3.51.4"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:00:00Z","timestamp":1775001600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:00:00Z","timestamp":1775001600000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:00:00Z","timestamp":1775001600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:00:00Z","timestamp":1775001600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2026,4]]},"DOI":"10.1109\/tvlsi.2026.3663564","type":"journal-article","created":{"date-parts":[[2026,2,24]],"date-time":"2026-02-24T21:01:05Z","timestamp":1771966865000},"page":"1087-1096","source":"Crossref","is-referenced-by-count":0,"title":["Efficient SoC Power Estimation With Machine Learning"],"prefix":"10.1109","volume":"34","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2642-2386","authenticated-orcid":false,"given":"Sujay","family":"Pandit","sequence":"first","affiliation":[{"name":"Elmore Family School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sujit","family":"Dey","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, UC San Diego, San Diego, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anand","family":"Raghunathan","sequence":"additional","affiliation":[{"name":"Elmore Family School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","first-page":"1","article-title":"PRIMAL: Power inference using machine learning","volume-title":"Proc. 56th ACM\/IEEE Design Autom. Conf. (DAC)","author":"Zhou"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3665314.3670823"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MLCAD48534.2019.9142100"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3466752.3480064"},{"key":"ref5","first-page":"1","article-title":"DEEP: Developing extremely efficient runtime on-chip power meters","volume-title":"Proc. IEEE\/ACM Int. Conf. Comput. Aided Design (ICCAD)","author":"Xie"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3352460.3358322"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18072.2020.9218643"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2008.16"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1995.480162"},{"key":"ref10","first-page":"83","article-title":"Wattch: A framework for architectural-level power analysis and optimizations","volume-title":"Proc. 27th Int. Symp. Comput. Archit.","author":"Brooks"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2445572.2445577"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1994.629783"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/217474.217601"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/icecs.1999.813262"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/92.406998"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1996.569539"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISPASS.2007.363746"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/1077603.1077657"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253186"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2014.17"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/277044.277215"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/3489517.3530601"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/icvd.2003.1183173"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1214\/09-AOS729"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.1409.3215"},{"key":"ref26","article-title":"Multi-task sequence to sequence learning","author":"Luong","year":"2015","journal-title":"arXiv:1511.06114"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1155\/2022\/5596676"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ivs.2018.8500658"},{"key":"ref29","first-page":"103","article-title":"On the properties of neural machine translation: Encoder\u2013decoder approaches","volume-title":"Proc. SSST-8, 8th Workshop Syntax, Semantics Struct. Stat. Transl.","author":"Cho"},{"key":"ref30","article-title":"Attention is all you need","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","author":"Vaswani"},{"key":"ref31","volume-title":"Arm Corstone SSE-300","year":"2026"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2016.130"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18074.2021.9586216"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/MSE.2007.44"},{"key":"ref35","volume-title":"GlobalFoundries 12LP+ FinFET","year":"2026"},{"key":"ref36","volume-title":"RISC-V Benchmarks","year":"2026"},{"key":"ref37","volume-title":"[Online]","author":"Xie","year":"2026"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/92\/11514136\/11409368-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/92\/11514136\/11409368.pdf?arnumber=11409368","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,12]],"date-time":"2026-05-12T05:41:23Z","timestamp":1778564483000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11409368\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,4]]},"references-count":37,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2026.3663564","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,4]]}}}