{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,29]],"date-time":"2026-05-29T20:05:58Z","timestamp":1780085158315,"version":"3.54.0"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T00:00:00Z","timestamp":1777593600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T00:00:00Z","timestamp":1777593600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T00:00:00Z","timestamp":1777593600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62027815"],"award-info":[{"award-number":["62027815"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62174048"],"award-info":[{"award-number":["62174048"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62274052"],"award-info":[{"award-number":["62274052"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2026,5]]},"DOI":"10.1109\/tvlsi.2026.3667721","type":"journal-article","created":{"date-parts":[[2026,3,4]],"date-time":"2026-03-04T20:52:57Z","timestamp":1772657577000},"page":"1631-1644","source":"Crossref","is-referenced-by-count":0,"title":["Reusing LBIST as a Physically Unclonable Function: A Low-Overhead PUF Capturing Circuit Transient Responses"],"prefix":"10.1109","volume":"34","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0718-029X","authenticated-orcid":false,"given":"Zhiwei","family":"Shao","sequence":"first","affiliation":[{"name":"School of Microelectronics, Hefei University of Technology, Hefei, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0307-7236","authenticated-orcid":false,"given":"Huaguo","family":"Liang","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Hefei University of Technology, Hefei, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shichao","family":"Bai","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Hefei University of Technology, Hefei, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-0713-0121","authenticated-orcid":false,"given":"Hongliang","family":"Lu","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Hefei University of Technology, Hefei, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-6500-2203","authenticated-orcid":false,"given":"Hao","family":"Lv","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Hefei University of Technology, Hefei, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8695-4478","authenticated-orcid":false,"given":"Zhengfeng","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Hefei University of Technology, Hefei, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2621-0933","authenticated-orcid":false,"given":"Yingchun","family":"Lu","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Hefei University of Technology, Hefei, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tdsc.2020.2993802"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2021.3087734"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1126\/science.1074376"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tifs.2023.3266624"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/jiot.2022.3142084"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/jiot.2021.3090475"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2021.3098018"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tc.2022.3207119"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2024.3466972"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2020.2980748"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tmc.2024.3494612"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2020.2996772"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2005.854635"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2008.2009417"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tetc.2020.3021820"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/vts.2007.29"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tetc.2014.2304492"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tsmc.2020.3036879"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/iscas58744.2024.10558312"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2015.2421933"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/tifs.2016.2613847"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2022.3206227"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.6028\/NIST.SP.800-22r1a"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/jiot.2023.3285930"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2023.3282629"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2022.104667"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/tmscs.2016.2519902"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ats49688.2020.9301590"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2018.2806041"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2024.3359777"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2024.3425957"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/jetcas.2021.3075767"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2022.3208325"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2024.3438362"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/tifs.2023.3263621"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3151229"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3085347"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.segan.2023.101228"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/92\/11538104\/11421094.pdf?arnumber=11421094","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,29]],"date-time":"2026-05-29T19:59:18Z","timestamp":1780084758000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11421094\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5]]},"references-count":38,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2026.3667721","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,5]]}}}