{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,17]],"date-time":"2026-08-17T19:35:58Z","timestamp":1786995358066,"version":"build-2736575974"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Veh. Technol."],"published-print":{"date-parts":[[2026,8]]},"DOI":"10.1109\/tvt.2026.3672820","type":"journal-article","created":{"date-parts":[[2026,3,10]],"date-time":"2026-03-10T19:52:57Z","timestamp":1773172377000},"page":"15663-15673","source":"Crossref","is-referenced-by-count":0,"title":["Deep Neural Networks Driven Network Security Risk Analysis in Autonomous Driving"],"prefix":"10.1109","volume":"75","author":[{"ORCID":"https:\/\/orcid.org\/0009-0001-7327-0111","authenticated-orcid":false,"given":"Jun","family":"Li","sequence":"first","affiliation":[{"name":"Qingdao University of Technology","place":["Qingdao, China"],"department":["Office of Informatization Construction and Management"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0374-0085","authenticated-orcid":false,"given":"Dong","family":"Liu","sequence":"additional","affiliation":[{"name":"Shandong Youth University of Political Science","place":["Jinan, China"],"department":["School of Information Engineering"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3020-3947","authenticated-orcid":false,"given":"Neeraj","family":"Kumar","sequence":"additional","affiliation":[{"name":"Thapar Institute of Engineering and Technology","place":["Patiala, India"]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1504\/WRITR.2020.106442"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-023-14417-x"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2025.112510"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2025.3613829"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.inffus.2025.103916"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.vehcom.2019.100214"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-41181-6_15"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.70695\/AA1202502A09"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s10462-020-09825-6"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s10207-019-00482-7"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.comnet.2019.05.013"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-019-04152-6"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3001350"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10489-020-01694-4"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.107450"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2020.2991876"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2022.03.065"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.comnet.2021.107871"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2021.115524"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2972627"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.cose.2021.102177"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICCES45898.2019.9002221"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2973730"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TNSE.2020.3004312"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1126\/science.1127647"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2025.113674"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-16-6328-4_79"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-019-04097-w"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.3390\/e21050485"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.48550\/ARXIV.1807.06521"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1080\/01969722.2023.2296246"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1186\/s40537-021-00444-8"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2025.113993"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-16-9423-3_67"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ICAIIC64266.2025.10920760"},{"issue":"1","key":"ref36","first-page":"46","article-title":"Comparative analysis of machine learning classifiers using the NSL-KDD dataset","volume":"23","author":"Boadi","year":"2025","journal-title":"Int. J. Comput. Sci. Netw. Secur."},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1002\/spy2.483"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1007\/s10291-024-01719-2"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/IGARSS53475.2024.10641464"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1145\/3491003.3491024"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2021.3065918"}],"container-title":["IEEE Transactions on Vehicular Technology"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/25\/11646490\/11429588.pdf?arnumber=11429588","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,8,17]],"date-time":"2026-08-17T19:06:01Z","timestamp":1786993561000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11429588\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,8]]},"references-count":41,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tvt.2026.3672820","relation":{},"ISSN":["0018-9545","1939-9359"],"issn-type":[{"value":"0018-9545","type":"print"},{"value":"1939-9359","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,8]]}}}