{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T04:46:11Z","timestamp":1729658771765,"version":"3.28.0"},"reference-count":34,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/uemcon.2016.7777920","type":"proceedings-article","created":{"date-parts":[[2016,12,12]],"date-time":"2016-12-12T20:35:39Z","timestamp":1481574939000},"page":"1-4","source":"Crossref","is-referenced-by-count":2,"title":["Technology and performance: Carbon nanotube (CNT) field effect transistor (FET) in VLSI circuit design"],"prefix":"10.1109","author":[{"given":"Soheli","family":"Farhana","sequence":"first","affiliation":[]},{"given":"Mohd Fauzan","family":"Noordin","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/s11671-010-9575-4"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1587\/elex.6.1395"},{"key":"ref31","article-title":"Understanding the Basic Advantages of Bulk FinFETs for Sub-and Near-Threshold Logic Circuits From Device Measurements","volume":"59","author":"crupi","year":"2013","journal-title":"IEEE Transaction on circuits and systems Express Briefs"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1999.824182"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.bbamcr.2010.10.013"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DRC.2005.1553099"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.93.196805"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.89.106801"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1116\/1.1521731"},{"key":"ref14","first-page":"703","article-title":"Performance analysis and design optimization of near ballistic CN field-effect transistors","author":"guo","year":"2014","journal-title":"IEDM Tech Dig"},{"key":"ref15","first-page":"522","article-title":"Performance of carbon nanotube field effect transistors with doped source and drain extensions and arbitrary geometry","author":"gianluca","year":"2005","journal-title":"Electron Devices Meeting 2005 IEDM Technical Digest IEEE International"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2003.1269387"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/16.887014"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2003.1221121"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.909043"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1088\/0954-3899\/37\/7A\/075021"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1021\/nl101680s"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-38348-9_37"},{"key":"ref3","doi-asserted-by":"crossref","DOI":"10.1002\/9783527629930","author":"guldi","year":"2010","journal-title":"Carbon Nanotubes and Related Structures Synthesis Characterization Functionalization and Applications"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1021\/nl902522f"},{"journal-title":"Institutions and Organizations Sage","year":"2001","author":"scott","key":"ref29"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2011.1"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/S0921-4526(02)00869-4"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.2209887"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2007.89"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2009.2036845"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/354056a0"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1140\/epjb\/e2009-00434-6"},{"key":"ref22","article-title":"Quantum confinement effects and source-to-drain tunneling in ultra-scaled double-gate silicon nMOSFETs","volume":"21","author":"xiang-wei","year":"2012","journal-title":"Chinese Physics B"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1063\/1.3556430"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2006.1708731"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2008.11.062"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201202699"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1021\/nl025577o"}],"event":{"name":"2016 IEEE 7th Annual Ubiquitous Computing, Electronics & Mobile Communication Conference (UEMCON)","start":{"date-parts":[[2016,10,20]]},"location":"New York City, NY, USA","end":{"date-parts":[[2016,10,22]]}},"container-title":["2016 IEEE 7th Annual Ubiquitous Computing, Electronics & Mobile Communication Conference (UEMCON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7763653\/7777798\/07777920.pdf?arnumber=7777920","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,16]],"date-time":"2019-09-16T08:50:41Z","timestamp":1568623841000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7777920\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/uemcon.2016.7777920","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}