{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,6]],"date-time":"2026-02-06T06:02:19Z","timestamp":1770357739273,"version":"3.49.0"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,9,1]]},"DOI":"10.1109\/vdat63601.2024.10705694","type":"proceedings-article","created":{"date-parts":[[2024,10,9]],"date-time":"2024-10-09T17:45:58Z","timestamp":1728495958000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["Classification Algorithm for VLSI Test Cost Reduction"],"prefix":"10.1109","author":[{"given":"Farook Basha","family":"Shaik","sequence":"first","affiliation":[{"name":"Maulana Azad National Institute of Technology,Department of Electronics and Communication Engineering,Bhopal,India"}]},{"given":"Manish","family":"Kashyap","sequence":"additional","affiliation":[{"name":"Maulana Azad National Institute of Technology,Department of Electronics and Communication Engineering,Bhopal,India"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-DAT.2018.8373239"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2021.08.009"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2016.2547904"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2019.8758628"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ETSYM.2010.5512789"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/43.277614"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2011.118"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651891"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2016.7428100"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2022.06.005"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1989.100747"},{"key":"ref12","first-page":"708","article-title":"Automated failure population creation for validating integrated circuit diagnosis methods","volume-title":"46th ACM\/IEEE Design Automation Conference","author":"Tam"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041765"},{"key":"ref14","article-title":"Analysis of Performance and Convergence Issues for Circuit Simulation (Ph.D. thesis)","author":"Quarles","year":"1989","journal-title":"EECS Department, University of California, Berkeley"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1111\/j.2517-6161.1996.tb02080.x"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/CCIS.2018.8691348"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3016039"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2017.2731311"}],"event":{"name":"2024 28th International Symposium on VLSI Design and Test (VDAT)","location":"Vellore, India","start":{"date-parts":[[2024,9,1]]},"end":{"date-parts":[[2024,9,3]]}},"container-title":["2024 28th International Symposium on VLSI Design and Test (VDAT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10705646\/10705432\/10705694.pdf?arnumber=10705694","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,10]],"date-time":"2024-10-10T12:27:24Z","timestamp":1728563244000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10705694\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,9,1]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/vdat63601.2024.10705694","relation":{},"subject":[],"published":{"date-parts":[[2024,9,1]]}}}