{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,11]],"date-time":"2025-06-11T20:45:02Z","timestamp":1749674702495,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,9,1]]},"DOI":"10.1109\/vdat63601.2024.10705718","type":"proceedings-article","created":{"date-parts":[[2024,10,9]],"date-time":"2024-10-09T17:45:58Z","timestamp":1728495958000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Design and Analysis of 8T Radiation Hardened SRAM using 65nm Process"],"prefix":"10.1109","author":[{"given":"Hari Shanker","family":"Gupta","sequence":"first","affiliation":[{"name":"ISRO,Space Applications Centre,Ahmedabad,India"}]},{"given":"Singh Shruti","family":"Satyendra","sequence":"additional","affiliation":[{"name":"ISRO,Space Applications Centre,Ahmedabad,India"}]},{"given":"Bhumika","family":"Deo","sequence":"additional","affiliation":[{"name":"ISRO,Space Applications Centre,Ahmedabad,India"}]},{"given":"Rane Prathamesh","family":"Santosh","sequence":"additional","affiliation":[{"name":"ISRO,Space Applications Centre,Ahmedabad,India"}]},{"given":"Ritesh","family":"Khole","sequence":"additional","affiliation":[{"name":"ISRO,Space Applications Centre,Ahmedabad,India"}]},{"given":"Varun Dev","family":"Singh","sequence":"additional","affiliation":[{"name":"ISRO,Space Applications Centre,Ahmedabad,India"}]},{"given":"Nishant","family":"Kumar","sequence":"additional","affiliation":[{"name":"ISRO,Space Applications Centre,Ahmedabad,India"}]},{"given":"Krish","family":"Prakash","sequence":"additional","affiliation":[{"name":"Vellore Institute of Technology Engineering,Vellore,India"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-021-05941-5"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DFT56152.2022.9962348"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2348872"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/NSREC.2018.8584290"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/23.490754"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ASICON47005.2019.8983476"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2015.7365677"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LAEDC54796.2022.9908181"},{"issue":"4","key":"ref9","first-page":"1619","article-title":"Implementation of a radiation-hardened i-gate n-mosfet and analysis of its tid (total ionizing dose) effects","volume":"12","author":"Lee","year":"2017","journal-title":"Journal of Electrical Engineering and Technology"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3074699"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IMPACT55510.2022.10029130"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/PARC59193.2024.10486426"}],"event":{"name":"2024 28th International Symposium on VLSI Design and Test (VDAT)","start":{"date-parts":[[2024,9,1]]},"location":"Vellore, India","end":{"date-parts":[[2024,9,3]]}},"container-title":["2024 28th International Symposium on VLSI Design and Test (VDAT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10705646\/10705432\/10705718.pdf?arnumber=10705718","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,10]],"date-time":"2024-10-10T13:34:53Z","timestamp":1728567293000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10705718\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,9,1]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/vdat63601.2024.10705718","relation":{},"subject":[],"published":{"date-parts":[[2024,9,1]]}}}