{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T00:40:18Z","timestamp":1725410418747},"reference-count":4,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,4]]},"DOI":"10.1109\/vldi-dat.2013.6533878","type":"proceedings-article","created":{"date-parts":[[2013,6,26]],"date-time":"2013-06-26T17:24:15Z","timestamp":1372267455000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["A process-scalable RF transmitter using 90nm and 65nm Si CMOS"],"prefix":"10.1109","author":[{"given":"A.","family":"Shirane","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Ito","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.","family":"Ishihara","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Masu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2012.6242320"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2162909"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/4.16317"},{"journal-title":"International Technology Roadmap for Semiconductors Reports","year":"0","key":"4"}],"event":{"name":"2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","start":{"date-parts":[[2013,4,22]]},"location":"Hsinchu","end":{"date-parts":[[2013,4,24]]}},"container-title":["2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6526674\/6533796\/06533878.pdf?arnumber=6533878","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T18:50:48Z","timestamp":1490208648000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6533878\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,4]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/vldi-dat.2013.6533878","relation":{},"subject":[],"published":{"date-parts":[[2013,4]]}}}