{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T03:22:52Z","timestamp":1725506572554},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,4]]},"DOI":"10.1109\/vlsi-dat.2012.6212639","type":"proceedings-article","created":{"date-parts":[[2012,6,19]],"date-time":"2012-06-19T21:01:09Z","timestamp":1340139669000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Test for more than pass\/fail using on-chip temperature sensor"],"prefix":"10.1109","author":[{"family":"Chih-Wea Wang","sequence":"first","affiliation":[]},{"family":"Chen-Tung Lin","sequence":"additional","affiliation":[]},{"family":"Chun-Chieh Hsu","sequence":"additional","affiliation":[]},{"family":"Ching-Tung Wu","sequence":"additional","affiliation":[]},{"family":"Chi-Feng Wu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.804385"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1999.782207"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669168"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2000.855298"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/VDAT.2011.5783597"},{"key":"6","doi-asserted-by":"crossref","first-page":"396","DOI":"10.1145\/1278480.1278582","article-title":"characterizing process variation in nanometer cmos","author":"agarwal","year":"2007","journal-title":"2007 44th ACM\/IEEE Design Automation Conference DAC"},{"key":"5","first-page":"652","article-title":"Worst-case circuit delay taking into account power supply variations","author":"kouroussis","year":"2004","journal-title":"Proceedings 41st Design Automation Conference 2004 DAC"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/43.980256"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1629917"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2010.5537410"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.858476"}],"event":{"name":"2012 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","start":{"date-parts":[[2012,4,23]]},"location":"Hsinchu","end":{"date-parts":[[2012,4,25]]}},"container-title":["Proceedings of Technical Program of 2012 VLSI Design, Automation and Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6204369\/6212573\/06212639.pdf?arnumber=6212639","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T20:18:10Z","timestamp":1497989890000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6212639\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,4]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/vlsi-dat.2012.6212639","relation":{},"subject":[],"published":{"date-parts":[[2012,4]]}}}