{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T12:26:53Z","timestamp":1725539213081},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,4]]},"DOI":"10.1109\/vlsi-dat.2014.6834866","type":"proceedings-article","created":{"date-parts":[[2014,6,20]],"date-time":"2014-06-20T21:53:41Z","timestamp":1403301221000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["On efficient error-tolerability evaluation and maximization for image processing applications"],"prefix":"10.1109","author":[{"given":"Tong-Yu","family":"Hsieh","sequence":"first","affiliation":[]},{"given":"Kuan-Hsien","family":"Li","sequence":"additional","affiliation":[]},{"given":"Yi-Han","family":"Peng","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"2008","author":"gonzalez","journal-title":"Digital Image Processing","key":"13"},{"doi-asserted-by":"publisher","key":"11","DOI":"10.1109\/TIP.2003.819861"},{"key":"12","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4757-6017-0","author":"pitas","year":"1990","journal-title":"Nonlinear Digital Filters Principles and Applications"},{"key":"3","first-page":"684","article-title":"SSD-based testing scheme for error tolerance analysis in H. 264\/AVC encoder","author":"hsu","year":"2008","journal-title":"Proc Int Conf Communications Circuits and Systems"},{"key":"2","doi-asserted-by":"crossref","first-page":"523","DOI":"10.1109\/DFTVS.2005.38","article-title":"Hardware testing for error tolerant multimedia compression based on linear transforms","author":"chong","year":"2005","journal-title":"Proc Int'l Symp on Defect and Fault Tolerance in VLSI Systems"},{"doi-asserted-by":"publisher","key":"1","DOI":"10.1109\/MDT.2004.8"},{"doi-asserted-by":"publisher","key":"10","DOI":"10.1109\/ATS.2013.60"},{"doi-asserted-by":"publisher","key":"7","DOI":"10.1109\/ATS.2008.75"},{"doi-asserted-by":"publisher","key":"6","DOI":"10.1109\/TEST.2006.297636"},{"doi-asserted-by":"publisher","key":"5","DOI":"10.1109\/TC.2007.1017"},{"doi-asserted-by":"publisher","key":"4","DOI":"10.1109\/MDT.2008.30"},{"doi-asserted-by":"publisher","key":"9","DOI":"10.1007\/BF02476026"},{"doi-asserted-by":"publisher","key":"8","DOI":"10.1109\/ATS.2011.72"}],"event":{"name":"2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","start":{"date-parts":[[2014,4,28]]},"location":"Hsinchu, Taiwan","end":{"date-parts":[[2014,4,30]]}},"container-title":["Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6823815\/6834858\/06834866.pdf?arnumber=6834866","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,11]],"date-time":"2019-08-11T15:55:42Z","timestamp":1565538942000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6834866\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,4]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/vlsi-dat.2014.6834866","relation":{},"subject":[],"published":{"date-parts":[[2014,4]]}}}