{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T02:30:26Z","timestamp":1725676226527},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,4]]},"DOI":"10.1109\/vlsi-dat.2014.6834928","type":"proceedings-article","created":{"date-parts":[[2014,6,20]],"date-time":"2014-06-20T21:53:41Z","timestamp":1403301221000},"page":"1-1","source":"Crossref","is-referenced-by-count":9,"title":["Scaling trends and challenges of advanced memory technology"],"prefix":"10.1109","author":[{"given":"Seok-Hee","family":"Lee","sequence":"first","affiliation":[]}],"member":"263","event":{"name":"2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","start":{"date-parts":[[2014,4,28]]},"location":"Hsinchu, Taiwan","end":{"date-parts":[[2014,4,30]]}},"container-title":["Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6823815\/6834858\/06834928.pdf?arnumber=6834928","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T15:10:11Z","timestamp":1490281811000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6834928\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,4]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/vlsi-dat.2014.6834928","relation":{},"subject":[],"published":{"date-parts":[[2014,4]]}}}