{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T06:54:45Z","timestamp":1729666485633,"version":"3.28.0"},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,4]]},"DOI":"10.1109\/vlsi-dat.2014.6834931","type":"proceedings-article","created":{"date-parts":[[2014,6,21]],"date-time":"2014-06-21T01:53:41Z","timestamp":1403315621000},"page":"1-2","source":"Crossref","is-referenced-by-count":4,"title":["Advanced CMOS reliability challenges"],"prefix":"10.1109","author":[{"given":"Chetan","family":"Prasad","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"IRPS","year":"2013","author":"kerber","key":"19"},{"key":"22","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1155\/2011\/343787","author":"kuhn","year":"2011","journal-title":"VLSI-TSA"},{"key":"17","first-page":"524","author":"rauch","year":"2007","journal-title":"TDMR"},{"key":"23","first-page":"1","author":"li","year":"2012","journal-title":"ICSICT"},{"key":"18","first-page":"26","author":"kaczer","year":"2010","journal-title":"IRPS"},{"journal-title":"IRPS","year":"2012","author":"wrachien","key":"24"},{"journal-title":"IRPS","year":"2013","author":"prasad","key":"15"},{"key":"16","first-page":"352","author":"ahn","year":"2005","journal-title":"IRPS"},{"key":"13","first-page":"8","author":"maeda","year":"2004","journal-title":"IRPS"},{"key":"14","first-page":"52","author":"groeseneken","year":"2008","journal-title":"IRPS"},{"key":"11","first-page":"131","author":"auth","year":"2012","journal-title":"VLSI Tech"},{"journal-title":"IRPS","year":"2013","author":"ramey","key":"12"},{"journal-title":"IRPS","year":"2014","author":"prasad","key":"21"},{"key":"3","first-page":"1","author":"natarajan","year":"2009","journal-title":"IEDM"},{"journal-title":"IEDM","year":"2013","author":"angot","key":"20"},{"key":"2","first-page":"352","author":"pae","year":"2008","journal-title":"IRPS"},{"key":"1","first-page":"247","author":"mistry","year":"2007","journal-title":"IEDM"},{"journal-title":"IRPS","year":"2012","author":"pae","key":"10"},{"key":"7","first-page":"5","volume":"5","author":"ribes","year":"2005","journal-title":"TDMR"},{"key":"6","first-page":"293","author":"prasad","year":"2010","journal-title":"IRPS"},{"key":"5","first-page":"1","author":"jan","year":"2008","journal-title":"IEDM"},{"key":"4","first-page":"287","author":"pae","year":"2010","journal-title":"IRPS"},{"key":"9","first-page":"369","author":"kerber","year":"2010","journal-title":"IRPS"},{"key":"8","first-page":"667","author":"prasad","year":"2008","journal-title":"IRPS"}],"event":{"name":"2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","start":{"date-parts":[[2014,4,28]]},"location":"Hsinchu, Taiwan","end":{"date-parts":[[2014,4,30]]}},"container-title":["Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6823815\/6834858\/06834931.pdf?arnumber=6834931","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,22]],"date-time":"2017-06-22T15:19:31Z","timestamp":1498144771000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6834931\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,4]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/vlsi-dat.2014.6834931","relation":{},"subject":[],"published":{"date-parts":[[2014,4]]}}}