{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T08:32:16Z","timestamp":1761985936977,"version":"build-2065373602"},"reference-count":4,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/vlsi-dat.2015.7114507","type":"proceedings-article","created":{"date-parts":[[2015,6,3]],"date-time":"2015-06-03T19:28:25Z","timestamp":1433359705000},"page":"1-4","source":"Crossref","is-referenced-by-count":3,"title":["A test-application-count based learning technique for test time reduction"],"prefix":"10.1109","author":[{"given":"Guo-Yu","family":"Lin","sequence":"first","affiliation":[]},{"given":"Kun-Han","family":"Tsai","sequence":"additional","affiliation":[]},{"given":"Jiun-Lang","family":"Huang","sequence":"additional","affiliation":[]},{"given":"Wu-Tung","family":"Cheng","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651891"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139173"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.27"},{"journal-title":"Technical Report ITRS","article-title":"Adaptive test white paper","year":"2013","key":"ref1"}],"event":{"name":"2015 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","start":{"date-parts":[[2015,4,27]]},"location":"Hsinchu, Taiwan","end":{"date-parts":[[2015,4,29]]}},"container-title":["VLSI Design, Automation and Test(VLSI-DAT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7111694\/7114493\/07114507.pdf?arnumber=7114507","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T20:54:19Z","timestamp":1490388859000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7114507\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/vlsi-dat.2015.7114507","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}