{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T05:12:34Z","timestamp":1725685954433},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/vlsi-dat.2015.7114508","type":"proceedings-article","created":{"date-parts":[[2015,6,3]],"date-time":"2015-06-03T15:28:25Z","timestamp":1433345305000},"page":"1-4","source":"Crossref","is-referenced-by-count":4,"title":["System-level test coverage prediction by structural stress test data mining"],"prefix":"10.1109","author":[{"given":"Bing-Yang","family":"Lin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cheng-Wen","family":"Wu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Harry H.","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583988"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.143"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.37"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437700"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783746"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VDAT.2011.5783603"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139174"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401595"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2014.52"},{"key":"ref19","article-title":"Learning from chips behaving badly","author":"chen","year":"0","journal-title":"Proc IEEE Int Workshop on Defects Adaptive Test and Data Analysis (DATA) 2014"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401533"},{"key":"ref3","article-title":"System-level testing for high-volume consumer products","author":"chen","year":"2013","journal-title":"Proc IEEE Int Test Conf (ITC)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.556983"},{"journal-title":"Design for Testability VLSI Test Principles and Architectures","year":"2006","author":"wang","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139153"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139131"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2011.2178387"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583992"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583989"}],"event":{"name":"2015 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","start":{"date-parts":[[2015,4,27]]},"location":"Hsinchu, Taiwan","end":{"date-parts":[[2015,4,29]]}},"container-title":["VLSI Design, Automation and Test(VLSI-DAT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7111694\/7114493\/07114508.pdf?arnumber=7114508","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T15:14:51Z","timestamp":1490368491000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7114508\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/vlsi-dat.2015.7114508","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}