{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,5]],"date-time":"2026-03-05T23:30:47Z","timestamp":1772753447706,"version":"3.50.1"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/vlsi-dat.2015.7114542","type":"proceedings-article","created":{"date-parts":[[2015,6,3]],"date-time":"2015-06-03T19:28:25Z","timestamp":1433359705000},"page":"1-3","source":"Crossref","is-referenced-by-count":6,"title":["Energy efficient design and energy harvesting for energy autonomous systems"],"prefix":"10.1109","author":[{"given":"Makoto","family":"Takamiya","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2012.6243856"},{"key":"ref3","first-page":"36c","article-title":"0.5V Image Processor with 563 GOPS\/W SIMD and 32bit CPU Using High Voltage Clock Distribution (HVCD) and Adaptive Frequency Scaling (AFS) with 40nm CMOS","author":"nomura","year":"2013","journal-title":"IEEE Symposium on VLSI Circuits"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7063043"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2185589"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2014.6858449"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2012.6177025"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2210953"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2012.6177102"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757525"},{"key":"ref1","first-page":"586","article-title":"24% Power Reduction by Post-Fabrication Dual Supply Voltage Control of 64 Voltage Domains in VDDmin Limited Ultra Low Voltage Logic Circuits","author":"yasufuku","year":"2012","journal-title":"IEEE International Symposium on Quality Electronic Design"}],"event":{"name":"2015 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","location":"Hsinchu, Taiwan","start":{"date-parts":[[2015,4,27]]},"end":{"date-parts":[[2015,4,29]]}},"container-title":["VLSI Design, Automation and Test(VLSI-DAT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7111694\/7114493\/07114542.pdf?arnumber=7114542","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T21:04:58Z","timestamp":1490389498000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7114542\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/vlsi-dat.2015.7114542","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}