{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T02:07:12Z","timestamp":1725415632429},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/vlsi-dat.2015.7114546","type":"proceedings-article","created":{"date-parts":[[2015,6,3]],"date-time":"2015-06-03T19:28:25Z","timestamp":1433359705000},"page":"1-2","source":"Crossref","is-referenced-by-count":0,"title":["SoC test integration platform"],"prefix":"10.1109","author":[{"given":"Augusli","family":"Kifli","sequence":"first","affiliation":[]},{"given":"K C","family":"Wu","sequence":"additional","affiliation":[]}],"member":"263","event":{"name":"2015 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","start":{"date-parts":[[2015,4,27]]},"location":"Hsinchu, Taiwan","end":{"date-parts":[[2015,4,29]]}},"container-title":["VLSI Design, Automation and Test(VLSI-DAT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7111694\/7114493\/07114546.pdf?arnumber=7114546","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T20:57:39Z","timestamp":1490389059000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7114546\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/vlsi-dat.2015.7114546","relation":{},"subject":[],"published":{"date-parts":[[2015,4]]}}}