{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T15:52:42Z","timestamp":1725724362513},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,4]]},"DOI":"10.1109\/vlsi-dat.2017.7939690","type":"proceedings-article","created":{"date-parts":[[2017,6,8]],"date-time":"2017-06-08T16:42:47Z","timestamp":1496940167000},"page":"1-1","source":"Crossref","is-referenced-by-count":0,"title":["World megatrend of intelligent robotics and AI: Impact on VLSI-DAT"],"prefix":"10.1109","author":[{"given":"Ren C.","family":"Luo","sequence":"first","affiliation":[]}],"member":"263","event":{"name":"2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","start":{"date-parts":[[2017,4,24]]},"location":"Hsinchu, Taiwan","end":{"date-parts":[[2017,4,27]]}},"container-title":["2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7936426\/7939640\/07939690.pdf?arnumber=7939690","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,8]],"date-time":"2017-06-08T16:42:55Z","timestamp":1496940175000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7939690\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,4]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/vlsi-dat.2017.7939690","relation":{},"subject":[],"published":{"date-parts":[[2017,4]]}}}