{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,11]],"date-time":"2025-04-11T17:29:38Z","timestamp":1744392578941},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,4]]},"DOI":"10.1109\/vlsi-dat.2018.8373256","type":"proceedings-article","created":{"date-parts":[[2018,6,7]],"date-time":"2018-06-07T19:36:08Z","timestamp":1528400168000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Digital intelligence and chip design"],"prefix":"10.1109","author":[{"given":"Sashi","family":"Obilisetty","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"The MIT Encyclopedia of the Cognitive Science","year":"1999","author":"dayan","key":"ref4"},{"journal-title":"Reinforcement Learning An Introduction","year":"2017","author":"sutton","key":"ref3"},{"key":"ref10","article-title":"Improving Verification Predictability and Efficiency Using Big Data","author":"may","year":"2018","journal-title":"Proc DVCON"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IPDPSW.2017.54"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2016.2621883"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2015.7059020"},{"key":"ref7","first-page":"15","article-title":"Routability Optimization for Industrial Designs at Sub-14nm Process Nodes Using Machine Learning","author":"chan","year":"0","journal-title":"Proceedings of the 2017 ACM on International Symposium on Physical Design (ISPD 17"},{"journal-title":"Deep Learning","year":"2016","author":"goodfellow","key":"ref2"},{"key":"ref9","article-title":"Improving the semiconductor industry through advanced analytics","author":"batra","year":"2016","journal-title":"McKinsey Article"},{"journal-title":"Pattern Recognition and Machine Learning","year":"2006","author":"bishop","key":"ref1"}],"event":{"name":"2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","start":{"date-parts":[[2018,4,16]]},"location":"Hsinchu","end":{"date-parts":[[2018,4,19]]}},"container-title":["2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8370612\/8373223\/08373256.pdf?arnumber=8373256","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,7,2]],"date-time":"2018-07-02T21:14:06Z","timestamp":1530566046000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8373256\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,4]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/vlsi-dat.2018.8373256","relation":{},"subject":[],"published":{"date-parts":[[2018,4]]}}}