{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T03:03:39Z","timestamp":1725591819760},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,4]]},"DOI":"10.1109\/vlsi-dat.2019.8741856","type":"proceedings-article","created":{"date-parts":[[2019,6,21]],"date-time":"2019-06-21T02:19:04Z","timestamp":1561083544000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Primitive Concept Identification In A Given Set Of Wafer Maps"],"prefix":"10.1109","author":[{"given":"Ahmed","family":"Wahba","sequence":"first","affiliation":[]},{"given":"Chuanhe Jay","family":"Shan","sequence":"additional","affiliation":[]},{"given":"Li-C.","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Nik","family":"Sumikawa","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"1","article-title":"Wafer pattern recognition using tucker decomposition","author":"wahba","year":"2019","journal-title":"VLSI Test Symposium (VTS) 2019 IEEE 37th"},{"journal-title":"Improved techniques for training gans","year":"2016","author":"salimans","key":"ref3"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.1980.1102314"},{"key":"ref6","first-page":"442","article-title":"Tensorizing neural networks","author":"novikov","year":"2015","journal-title":"Advances in neural information processing systems"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1137\/S0895479896305696"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1137\/07070111X"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1137\/S0895479898346995"},{"journal-title":"Intriguing properties of neural networks","year":"2013","author":"szegedy","key":"ref8"},{"journal-title":"Speeding-up convolutional neural networks using fine-tuned cp-decomposition","year":"2014","author":"lebedev","key":"ref7"},{"journal-title":"Generative adversarial networks","year":"2014","author":"goodfellow","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/BF02289464"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624714"}],"event":{"name":"2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","start":{"date-parts":[[2019,4,22]]},"location":"Hsinchu, Taiwan","end":{"date-parts":[[2019,4,25]]}},"container-title":["2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8734473\/8741402\/08741856.pdf?arnumber=8741856","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:10:06Z","timestamp":1657854606000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8741856\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,4]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/vlsi-dat.2019.8741856","relation":{},"subject":[],"published":{"date-parts":[[2019,4]]}}}