{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T15:50:43Z","timestamp":1730303443255,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,8]]},"DOI":"10.1109\/vlsi-dat49148.2020.9196260","type":"proceedings-article","created":{"date-parts":[[2020,9,15]],"date-time":"2020-09-15T17:36:04Z","timestamp":1600191364000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Integrated Group-based Valuable Sensor Selection Approach for Remaining Machinery Life Estimation in the Future Industry 4.0 Era"],"prefix":"10.1109","author":[{"given":"Kun-Chih","family":"Chen","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zi-Jie","family":"Gao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1016\/j.microrel.2015.06.076"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/CPRE.2014.6798991"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TNNLS.2016.2542866"},{"key":"ref5","first-page":"122","article-title":"Feature selection based on mutual information: criteria of max-dependency, max-relevance, and min-redundancy","volume":"27","author":"peng","year":"2005","journal-title":"IEEE Transactions on Pattern Analysis and Machine Intelligence"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1016\/j.ress.2017.11.021"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/IJCNN.2016.7727831"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1007\/978-3-319-55852-3_2"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1111\/j.2517-6161.1996.tb02080.x"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/ICICE.2017.8478928"}],"event":{"name":"2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","start":{"date-parts":[[2020,8,10]]},"location":"Hsinchu, Taiwan","end":{"date-parts":[[2020,8,13]]}},"container-title":["2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9189776\/9196212\/09196260.pdf?arnumber=9196260","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,30]],"date-time":"2022-06-30T11:17:08Z","timestamp":1656587828000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9196260\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,8]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/vlsi-dat49148.2020.9196260","relation":{},"subject":[],"published":{"date-parts":[[2020,8]]}}}