{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T08:01:48Z","timestamp":1725436908360},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,10]]},"DOI":"10.1109\/vlsi-soc.2012.6379041","type":"proceedings-article","created":{"date-parts":[[2012,12,18]],"date-time":"2012-12-18T21:55:47Z","timestamp":1355867747000},"page":"259-262","source":"Crossref","is-referenced-by-count":1,"title":["A new reliability evaluation methodology and its application to network-on-chip routers"],"prefix":"10.1109","author":[{"given":"Hamed S.","family":"Kia","sequence":"first","affiliation":[]},{"given":"Cristinel","family":"Ababei","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"0","key":"19"},{"key":"22","doi-asserted-by":"crossref","first-page":"812","DOI":"10.1145\/1629911.1630119","article-title":"vicis: a reliable network for unreliable silicon","author":"fick","year":"2009","journal-title":"2009 46th ACM\/IEEE Design Automation Conference dac"},{"key":"17","article-title":"Application-specific MPSoC reliability optimization","author":"gu","year":"2008","journal-title":"IEEE TVLSI"},{"journal-title":"Principles and Practices of Interconnection Networks","year":"2004","author":"dally","key":"23"},{"key":"18","article-title":"Scalable methods for analyzing the circuit failure probability due to gate oxide breakdown","author":"fang","year":"2011","journal-title":"IEEE TVLSI"},{"year":"0","key":"24"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1166\/jolpe.2006.007"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2007.8"},{"key":"13","doi-asserted-by":"crossref","DOI":"10.1109\/TDMR.2006.876572","article-title":"A new SPICE reliability simulation method for deep submicrometer CMOS VLSI circuits","author":"li","year":"2006","journal-title":"IEEE Trans on Device and Materials Reliability"},{"key":"14","doi-asserted-by":"crossref","DOI":"10.1109\/TDMR.2008.915629","article-title":"Compact modeling of MOSFET wearout mechanisms for circuit-reliability simulation","author":"li","year":"2008","journal-title":"IEEE Trans on Device and Materials Reliability"},{"key":"11","article-title":"Exploiting structural duplication for lifetime reliability enhancement","author":"srinivasan","year":"2005","journal-title":"IEEE ISCA"},{"key":"12","article-title":"Deep submicron CMOS integrated circuit reliability simulation with SPICE","author":"li","year":"2005","journal-title":"ACM\/IEEE ISQED"},{"year":"0","key":"21"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1063\/1.1567461"},{"year":"0","key":"20"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1147\/rd.462.0265"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2005.110"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ISPASS.2008.4510752"},{"journal-title":"Microelectronics Reliability Physics-of-failure Based Modeling and Lifetime Evaluation","year":"2008","author":"white","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.12.004"},{"journal-title":"JEDEC Publication","article-title":"Failure mechanisms and models for semiconductor devices","year":"2009","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2004.1283680"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2005.54"},{"key":"8","article-title":"RAMP: A model for reliability aware microprocessor design","author":"srinivasan","year":"2003","journal-title":"IBM Research Report"}],"event":{"name":"2012 IEEE\/IFIP 20th International Conference on VLSI and System-on-Chip (VLSI-SoC)","start":{"date-parts":[[2012,10,7]]},"location":"Santa Cruz, CA, USA","end":{"date-parts":[[2012,10,10]]}},"container-title":["2012 IEEE\/IFIP 20th International Conference on VLSI and System-on-Chip (VLSI-SoC)"],"original-title":[],"deposited":{"date-parts":[[2020,10,14]],"date-time":"2020-10-14T15:27:01Z","timestamp":1602689221000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6379041"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,10]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/vlsi-soc.2012.6379041","relation":{},"subject":[],"published":{"date-parts":[[2012,10]]}}}