{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,7]],"date-time":"2025-10-07T11:55:20Z","timestamp":1759838120598,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,9]]},"DOI":"10.1109\/vlsi-soc.2016.7753546","type":"proceedings-article","created":{"date-parts":[[2016,11,24]],"date-time":"2016-11-24T21:38:54Z","timestamp":1480023534000},"page":"1-7","source":"Crossref","is-referenced-by-count":1,"title":["Efficient handling of the fault space in functional safety analysis utilizing formal methods"],"prefix":"10.1109","author":[{"given":"Alessandro","family":"Bernardini","sequence":"first","affiliation":[]},{"given":"Wolfgang","family":"Ecker","sequence":"additional","affiliation":[]},{"given":"Ulf","family":"Schlichtmann","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1007\/978-3-642-21455-4_3"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/2.585157"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1007\/978-3-540-72522-0_6"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/DATE.2007.364501"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"24","DOI":"10.1007\/978-3-642-14295-6_5","article-title":"Abc: An academic industrial-strength verification tool","author":"brayton","year":"2010","journal-title":"Computer Aided Verification"},{"key":"ref3","first-page":"1","article-title":"Symbolic Fault Modeling and Model Counting for the Identification of Critical Gates in Digital Circuits","author":"bernardini","year":"2015","journal-title":"ZuE 2015 8 GMM\/ITG\/GI-Symposium Reliability by Design ZuE"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1007\/s10836-015-5519-3"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/TC.1986.1676819"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1007\/3-540-46419-0_27"},{"year":"1999","author":"clarke","journal-title":"Orna Grumberg and Doron Peled Model Checking","key":"ref7"},{"key":"ref2","volume":"26202649","author":"baier","year":"2008","journal-title":"Principles of Model Checking"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/DFT.2009.21"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TCAD.2011.2120950"}],"event":{"name":"2016 IFIP\/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)","start":{"date-parts":[[2016,9,26]]},"location":"Tallinn, Estonia","end":{"date-parts":[[2016,9,28]]}},"container-title":["2016 IFIP\/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7744451\/7753408\/07753546.pdf?arnumber=7753546","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,15]],"date-time":"2019-09-15T23:20:21Z","timestamp":1568589621000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7753546\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,9]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/vlsi-soc.2016.7753546","relation":{},"subject":[],"published":{"date-parts":[[2016,9]]}}}