{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T17:25:30Z","timestamp":1729617930171,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,9]]},"DOI":"10.1109\/vlsi-soc.2016.7753567","type":"proceedings-article","created":{"date-parts":[[2016,11,24]],"date-time":"2016-11-24T21:38:54Z","timestamp":1480023534000},"page":"1-6","source":"Crossref","is-referenced-by-count":9,"title":["XbarGen: A memristor based boolean logic synthesis tool"],"prefix":"10.1109","author":[{"given":"Marcello","family":"Traiola","sequence":"first","affiliation":[]},{"given":"Mario","family":"Barbareschi","sequence":"additional","affiliation":[]},{"given":"Antonino","family":"Mazzeo","sequence":"additional","affiliation":[]},{"given":"Alberto","family":"Bosio","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1002\/adma.200900375"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2012.240"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/NanoArch.2013.6623028"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"389","DOI":"10.1021\/nl203687n","article-title":"A functional hybrid memristor crossbar-array\/cmos system for data storage and neuromorphic applications","volume":"12","author":"kim","year":"2011","journal-title":"Nano Letters"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2015.7357122"},{"journal-title":"ABC User Guide","year":"0","key":"ref15"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1629940"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2007.4405763"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"1718","DOI":"10.7873\/DATE.2015.1136","article-title":"Memristor based computation-in-memory architecture for data-intensive applications","author":"hamdioui","year":"2015","journal-title":"Proceedings of the conference on Design Automation and Test in Europe"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"1322","DOI":"10.1145\/1403375.1403694","article-title":"Emerging yield and reliability challenges in nanometer CMOS technologies","author":"gielen","year":"2008","journal-title":"Proceedings of the conference on Design Automation and Test in Europe"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s00339-004-3149-1"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IDT.2014.7038601"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-23096-7"},{"journal-title":"ITRS 2013 Rep","year":"0","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCT.1971.1083337"}],"event":{"name":"2016 IFIP\/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)","start":{"date-parts":[[2016,9,26]]},"location":"Tallinn, Estonia","end":{"date-parts":[[2016,9,28]]}},"container-title":["2016 IFIP\/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7744451\/7753408\/07753567.pdf?arnumber=7753567","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,15]],"date-time":"2019-09-15T23:20:26Z","timestamp":1568589626000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7753567\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,9]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/vlsi-soc.2016.7753567","relation":{},"subject":[],"published":{"date-parts":[[2016,9]]}}}