{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T03:56:04Z","timestamp":1725594964733},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,10]]},"DOI":"10.1109\/vlsi-soc.2019.8920355","type":"proceedings-article","created":{"date-parts":[[2019,12,6]],"date-time":"2019-12-06T08:10:45Z","timestamp":1575619845000},"page":"249-250","source":"Crossref","is-referenced-by-count":1,"title":["Impact of Process Variability and Single Event Transient on FinFET Technology"],"prefix":"10.1109","author":[{"given":"Leonardo H.","family":"Brendler","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alexandra L.","family":"Zimpeck","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cristina","family":"Meinhardt","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ricardo","family":"Reis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6532108"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2014.07.109"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2016.04.006"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s10825-006-0009-6"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2002.1175845"}],"event":{"name":"2019 IFIP\/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC)","start":{"date-parts":[[2019,10,6]]},"location":"Cuzco, Peru","end":{"date-parts":[[2019,10,9]]}},"container-title":["2019 IFIP\/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8910139\/8920290\/08920355.pdf?arnumber=8920355","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T14:50:29Z","timestamp":1658155829000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8920355\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,10]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/vlsi-soc.2019.8920355","relation":{},"subject":[],"published":{"date-parts":[[2019,10]]}}}