{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,14]],"date-time":"2025-07-14T02:32:57Z","timestamp":1752460377718,"version":"3.28.0"},"reference-count":23,"publisher":"IEEE","funder":[{"DOI":"10.13039\/100000185","name":"DARPA","doi-asserted-by":"publisher","award":["FA8650-18-2-7851"],"award-info":[{"award-number":["FA8650-18-2-7851"]}],"id":[{"id":"10.13039\/100000185","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,10,5]]},"DOI":"10.1109\/vlsi-soc46417.2020.9344099","type":"proceedings-article","created":{"date-parts":[[2021,2,12]],"date-time":"2021-02-12T21:20:24Z","timestamp":1613164824000},"page":"192-197","source":"Crossref","is-referenced-by-count":1,"title":["Temperature and Supply Voltage Monitoring with Current-mode Relaxation Oscillators"],"prefix":"10.1109","author":[{"given":"Shanshan","family":"Dai","sequence":"first","affiliation":[]},{"given":"Caleb R.","family":"Tulloss","sequence":"additional","affiliation":[]},{"given":"Xiaoyu","family":"Lian","sequence":"additional","affiliation":[]},{"given":"Kangping","family":"Hu","sequence":"additional","affiliation":[]},{"given":"Sherief","family":"Reda","sequence":"additional","affiliation":[]},{"given":"Jacob K.","family":"Rosenstein","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"160","article-title":"A 0.6 nJ -0.22\/+0.19°C inaccuracy temperature sensor using exponential subthreshold oscillation dependence","author":"yang","year":"0","journal-title":"IEEE International Solid-State Circuits Conference (ISSCC)"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2707325"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"613","DOI":"10.1109\/JSSC.2019.2891718","article-title":"An 11-nW CMOS Temperature-to-Digital Converter Utilizing Sub-Threshold Current at Sub-Thermal Drain Voltage","volume":"54","author":"teruki","year":"2019","journal-title":"IEEE Journal of Solid-State Circuits"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2017.2739707"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IGCC.2018.8752140"},{"journal-title":"Smart Temperature Sensor Survey","year":"0","author":"makinwa","key":"ref15"},{"key":"ref16","article-title":"A 14.4 nW 122KHz dual-phase current-mode relaxation oscillator for near-zero-power sensors","author":"dai","year":"0","journal-title":"IEEE Custom Integrated Circuits Conference (CICC)"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2859834"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/4.760378"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/4.75016"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310303"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2010.5537410"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2746671"},{"key":"ref5","first-page":"1","article-title":"Worst-case IR-drop monitoring with 1GHz sampling rate","author":"hsu","year":"0","journal-title":"Int Symp on VLSI Design Automation and Test VLSI-DAT"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2871622"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2788878"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2861862"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2598765"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2646798"},{"key":"ref20","first-page":"222","article-title":"A 0.85 V 600nW all-CMOS temperature sensor with an inaccuracy of ±0.4°C(3?) from -40 to 125°C","author":"souri","year":"0","journal-title":"IEEE International Solid-State Circuits Conference(ISSCC)"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2638464"},{"key":"ref21","first-page":"1","article-title":"A 28nm CMOS ultra-compact thermal sensor in current-mode technique","author":"matthias","year":"0","journal-title":"IEEE Symposium on VLSI Circuits (VLSIC)"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2019.8702693"}],"event":{"name":"2020 IFIP\/IEEE 28th International Conference on Very Large Scale Integration (VLSI-SOC)","start":{"date-parts":[[2020,10,5]]},"location":"Salt Lake City, UT, USA","end":{"date-parts":[[2020,10,7]]}},"container-title":["2020 IFIP\/IEEE 28th International Conference on Very Large Scale Integration (VLSI-SOC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9344049\/9344068\/09344099.pdf?arnumber=9344099","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,2,2]],"date-time":"2022-02-02T15:23:48Z","timestamp":1643815428000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9344099\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,10,5]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/vlsi-soc46417.2020.9344099","relation":{},"subject":[],"published":{"date-parts":[[2020,10,5]]}}}