{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T20:56:18Z","timestamp":1725656178942},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,10,3]],"date-time":"2022-10-03T00:00:00Z","timestamp":1664755200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,3]],"date-time":"2022-10-03T00:00:00Z","timestamp":1664755200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,10,3]]},"DOI":"10.1109\/vlsi-soc54400.2022.9939575","type":"proceedings-article","created":{"date-parts":[[2022,11,8]],"date-time":"2022-11-08T20:41:50Z","timestamp":1667940110000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Linear and Periodic State Integrated Circuits Noise Simulation Benchmarking"],"prefix":"10.1109","author":[{"given":"Anastasios","family":"Michailidis","sequence":"first","affiliation":[{"name":"Aristotle University of Thessaloniki,Department of Physics,Thessaloniki,Greece"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Thomas","family":"Noulis","sequence":"additional","affiliation":[{"name":"Aristotle University of Thessaloniki,Department of Physics,Thessaloniki,Greece"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kostas","family":"Siozios","sequence":"additional","affiliation":[{"name":"Aristotle University of Thessaloniki,Department of Physics,Thessaloniki,Greece"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/16.47770"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(80)90198-7"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/16.974722"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/el.2015.3278"},{"journal-title":"User’s Manual","year":"2011","key":"ref14"},{"journal-title":"NXP Semiconductor","year":"2008","key":"ref15"},{"journal-title":"Cadence Design Systems","article-title":"Virtuoso Spectre Transient Noise Analysis","year":"0","key":"ref16"},{"journal-title":"Cadence Design Systems","article-title":"Application Notes on Direct Time-Domain Noise Analysis using Virtuoso Spectre","year":"2006","key":"ref17"},{"key":"ref18","first-page":"197","article-title":"Noise Analysis. Analog Design and Simulation Using OrCAD Capture and PSpice","author":"fitzpatrick","year":"2018"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/5.326411"},{"article-title":"Noise sources in bulk CMOS","year":"2002","author":"lundberg","key":"ref3"},{"article-title":"Analysis and Design @Analog Integrated Circuits","year":"0","author":"gray","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1965.3814"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/9780470547182"},{"article-title":"Noise Reduction Techniques in Electronic Systems","year":"1988","author":"ott","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/PATMOS.2016.7833428"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/16.936707"},{"key":"ref9","first-page":"343","article-title":"Operation and Modeling of the MOS Transistor","author":"tsividis","year":"1987"}],"event":{"name":"2022 IFIP\/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC)","start":{"date-parts":[[2022,10,3]]},"location":"Patras, Greece","end":{"date-parts":[[2022,10,5]]}},"container-title":["2022 IFIP\/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9939277\/9939284\/09939575.pdf?arnumber=9939575","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,11,28]],"date-time":"2022-11-28T20:22:01Z","timestamp":1669666921000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9939575\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10,3]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/vlsi-soc54400.2022.9939575","relation":{},"subject":[],"published":{"date-parts":[[2022,10,3]]}}}