{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,8]],"date-time":"2026-06-08T14:45:41Z","timestamp":1780929941950,"version":"3.54.1"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,16]],"date-time":"2023-10-16T00:00:00Z","timestamp":1697414400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,16]],"date-time":"2023-10-16T00:00:00Z","timestamp":1697414400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,16]]},"DOI":"10.1109\/vlsi-soc57769.2023.10321896","type":"proceedings-article","created":{"date-parts":[[2023,11,22]],"date-time":"2023-11-22T19:06:55Z","timestamp":1700680015000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Noise modeling using look-up tables and DC measurements for cryogenic applications"],"prefix":"10.1109","author":[{"given":"Giovani","family":"Britton","sequence":"first","affiliation":[{"name":"STMicroelectronics,Crolles,France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Salvador","family":"Mir","sequence":"additional","affiliation":[{"name":"Univ. Grenoble Alpes, CNRS, Grenoble-INP, TIMA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Estelle","family":"Lauga-Larroze","sequence":"additional","affiliation":[{"name":"Univ. Grenoble Alpes, CNRS, Grenoble-INP, TIMA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Benjamin","family":"Dormieu","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Quentin","family":"Berlingard","sequence":"additional","affiliation":[{"name":"Univ. Grenoble Alpes, CEA, LETI"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mickael","family":"Casse","sequence":"additional","affiliation":[{"name":"Univ. Grenoble Alpes, CEA, LETI"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Philippe","family":"Galy","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/30156"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms13575"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-017-01905-6"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-020-2171-6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevApplied.3.024010"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2019.03.033"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2023.108626"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2022.108340"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRev.72.26"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401136"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1017\/9781108125840"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2808184"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS46773.2023.10182026"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1976.1084200"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/22.32217"},{"key":"ref16","article-title":"MOSFET Modeling for Cryo-CMOS Applications","volume-title":"European Microwave Week, WM2\/Cryogenic RF-mmW Technology and circuit platforms: a path toward Quantum-Computing","author":"Enz"},{"key":"ref17","article-title":"RF Circuit Design with the Inversion Coefficient: EKV Parameter extraction for Analog\/RF Design","volume-title":"Joint IEEE and SoC Day: Inversion Coefficient and its Applications","author":"Delignac"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9781139021128"},{"key":"ref19","article-title":"Mod\u00e9lisation compacte des transistors MOS nanom\u00e9triques pour applications radiofr\u00e9quences et millim\u00e9triques","volume-title":"PhD thesis","author":"Dormieu","year":"2012"}],"event":{"name":"2023 IFIP\/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC)","location":"Dubai, United Arab Emirates","start":{"date-parts":[[2023,10,16]]},"end":{"date-parts":[[2023,10,18]]}},"container-title":["2023 IFIP\/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10321814\/10321836\/10321896.pdf?arnumber=10321896","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,2]],"date-time":"2024-03-02T21:06:10Z","timestamp":1709413570000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10321896\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,16]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/vlsi-soc57769.2023.10321896","relation":{},"subject":[],"published":{"date-parts":[[2023,10,16]]}}}