{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,25]],"date-time":"2026-07-25T15:21:09Z","timestamp":1784992869922,"version":"3.55.0"},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2015,6,1]],"date-time":"2015-06-01T00:00:00Z","timestamp":1433116800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2015,6,1]],"date-time":"2015-06-01T00:00:00Z","timestamp":1433116800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,6]]},"DOI":"10.1109\/vlsic.2015.7231356","type":"proceedings-article","created":{"date-parts":[[2015,9,3]],"date-time":"2015-09-03T21:50:20Z","timestamp":1441317020000},"page":"C142-C143","source":"Crossref","is-referenced-by-count":10,"title":["A 450-fs jitter PVT-robust fractional-resolution injection-locked clock multiplier using a DLL-based calibrator with replica-delay-cells"],"prefix":"10.1109","author":[{"given":"Mina","family":"Kim","sequence":"first","affiliation":[{"name":"Ulsan National Institute of Science and Technology (UNIST), Ulsan, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Seojin","family":"Choi","sequence":"additional","affiliation":[{"name":"Ulsan National Institute of Science and Technology (UNIST), Ulsan, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jaehyouk","family":"Choi","sequence":"additional","affiliation":[{"name":"Ulsan National Institute of Science and Technology (UNIST), Ulsan, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref4","first-page":"652","volume":"47","author":"izad","year":"2012","journal-title":"IEEE JSSC"},{"key":"ref3","first-page":"50","volume":"49","author":"musa","year":"2014","journal-title":"IEEE JSSC"},{"key":"ref5","first-page":"140","author":"liu","year":"2013","journal-title":"IEEE Symp on VLSI Circuits"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1017\/S1743921312023617"},{"key":"ref1","first-page":"336","author":"park","year":"2012","journal-title":"IEEE ISSCC"}],"event":{"name":"2015 Symposium on VLSI Circuits","location":"Kyoto, Japan","start":{"date-parts":[[2015,6,17]]},"end":{"date-parts":[[2015,6,19]]}},"container-title":["2015 Symposium on VLSI Circuits (VLSI Circuits)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7196579\/7231231\/07231356.pdf?arnumber=7231356","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,23]],"date-time":"2025-04-23T17:53:18Z","timestamp":1745430798000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7231356\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,6]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/vlsic.2015.7231356","relation":{},"subject":[],"published":{"date-parts":[[2015,6]]}}}