{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,10]],"date-time":"2026-05-10T04:41:18Z","timestamp":1778388078931,"version":"3.51.4"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,6]]},"DOI":"10.1109\/vlsic.2015.7231383","type":"proceedings-article","created":{"date-parts":[[2015,9,3]],"date-time":"2015-09-03T21:50:20Z","timestamp":1441317020000},"page":"T18-T19","source":"Crossref","is-referenced-by-count":1,"title":["Design and demonstration of reliability-aware Ge gate stacks with 0.5 nm EOT"],"prefix":"10.1109","author":[{"given":"C.","family":"Lu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C. H.","family":"Lee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Nishimura","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Toriumi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","volume":"40","author":"lee","year":"2013","journal-title":"IEDM"},{"key":"ref3","author":"zhang","year":"2011","journal-title":"IEDM"},{"key":"ref10","author":"lin","year":"2012","journal-title":"IEDM"},{"key":"ref6","author":"houssa","year":"2008","journal-title":"Surf Sci"},{"key":"ref5","doi-asserted-by":"crossref","DOI":"10.1023\/B:GPAC.0000007924.65496.ea","volume":"29","author":"plotnikov","year":"2003","journal-title":"Glass Phys Chem"},{"key":"ref8","author":"takagi","year":"2012","journal-title":"IEDM"},{"key":"ref7","volume":"116","author":"lu","year":"2014","journal-title":"JAP"},{"key":"ref2","first-page":"58","author":"kuzum","year":"2011","journal-title":"IEEE ED"},{"key":"ref9","author":"chen","year":"2010","journal-title":"IEDM"},{"key":"ref1","volume":"58","author":"lee","year":"2011","journal-title":"IEEE TED"}],"event":{"name":"2015 Symposium on VLSI Circuits","location":"Kyoto, Japan","start":{"date-parts":[[2015,6,17]]},"end":{"date-parts":[[2015,6,19]]}},"container-title":["2015 Symposium on VLSI Circuits (VLSI Circuits)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7196579\/7231231\/07231383.pdf?arnumber=7231383","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T18:54:46Z","timestamp":1498244086000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7231383\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,6]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/vlsic.2015.7231383","relation":{},"subject":[],"published":{"date-parts":[[2015,6]]}}}