{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T06:49:22Z","timestamp":1725432562925},"reference-count":5,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,6]]},"DOI":"10.1109\/vlsic.2016.7573514","type":"proceedings-article","created":{"date-parts":[[2016,10,6]],"date-time":"2016-10-06T18:39:47Z","timestamp":1475779187000},"page":"1-2","source":"Crossref","is-referenced-by-count":0,"title":["A 350mV\u2013900mV 2.1GHz 0.011mm<sup>2<\/sup>regular expression matching accelerator with aging-tolerant low-V&lt;inf&gt;MIN&lt;\/inf&gt; circuits in 14nm tri-gate CMOS"],"prefix":"10.1109","author":[{"given":"Amit","family":"Agarwal","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Steven","family":"Hsu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mark","family":"Anders","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sanu","family":"Mathew","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gregory","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Himanshu","family":"Kaul","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sudhir","family":"Satpathy","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ram","family":"Krishnamurthy","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"105","author":"agarwal","year":"2010","journal-title":"IEEE Symp on VLSI Circuits"},{"key":"ref3","first-page":"12t","author":"jan","year":"2015","journal-title":"IEEE Symp on VLSI Tech"},{"key":"ref5","first-page":"264","author":"yuffe","year":"2011","journal-title":"ISSCC Dig of Tech Papers"},{"key":"ref2","first-page":"390","author":"wang","year":"2008","journal-title":"ISSCC Dig of Tech Papers"},{"key":"ref1","first-page":"104","author":"johnson","year":"2010","journal-title":"ISSCC Dig of Tech Papers"}],"event":{"name":"2016 IEEE Symposium on VLSI Circuits","start":{"date-parts":[[2016,6,15]]},"location":"Honolulu, HI, USA","end":{"date-parts":[[2016,6,17]]}},"container-title":["2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7569797\/7573453\/07573514.pdf?arnumber=7573514","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,10,11]],"date-time":"2016-10-11T22:52:56Z","timestamp":1476226376000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7573514\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,6]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/vlsic.2016.7573514","relation":{},"subject":[],"published":{"date-parts":[[2016,6]]}}}