{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,26]],"date-time":"2025-04-26T05:06:13Z","timestamp":1745643973651},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,6]]},"DOI":"10.1109\/vlsicircuits18222.2020.9162872","type":"proceedings-article","created":{"date-parts":[[2020,8,10]],"date-time":"2020-08-10T22:28:11Z","timestamp":1597098491000},"page":"1-2","source":"Crossref","is-referenced-by-count":5,"title":["A 0.25-V, 5.3-pW Voltage Reference with 25-\u03bcV\/\u00b0C Temperature Coefficient, 140-\u03bcV\/V Line Sensitivity and 2,200-\u03bcm<sup>2<\/sup> Area in 180nm"],"prefix":"10.1109","author":[{"given":"Luigi","family":"Fassio","sequence":"first","affiliation":[]},{"given":"Longyang","family":"Lin","sequence":"additional","affiliation":[]},{"given":"Raffaele","family":"De Rose","sequence":"additional","affiliation":[]},{"given":"Marco","family":"Lanuzza","sequence":"additional","affiliation":[]},{"given":"Felice","family":"Crupi","sequence":"additional","affiliation":[]},{"given":"Massimo","family":"Alioto","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"volume-title":"VLSI","author":"Dong","key":"ref1"},{"volume-title":"JSSC","year":"2012","author":"Seok","key":"ref2"},{"volume-title":"JSSC","year":"2011","author":"Magnelli","key":"ref3"},{"volume-title":"JSSC","year":"2017","author":"Lee","key":"ref4"},{"volume-title":"ISSCC","author":"Shrivastava","key":"ref5"},{"volume-title":"ISSCC","author":"Ji","key":"ref6"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870429"},{"volume-title":"JSSC","year":"2013","author":"Osaki","key":"ref8"},{"volume-title":"VLSI","author":"Kim","key":"ref9"},{"volume-title":"VLSI","author":"Lee","key":"ref10"},{"volume-title":"ISSCC","author":"Ji","key":"ref11"},{"volume-title":"VLSI","author":"Lin","key":"ref12"}],"event":{"name":"2020 IEEE Symposium on VLSI Circuits","start":{"date-parts":[[2020,6,16]]},"location":"Honolulu, HI, USA","end":{"date-parts":[[2020,6,19]]}},"container-title":["2020 IEEE Symposium on VLSI Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9146894\/9162771\/09162872.pdf?arnumber=9162872","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,24]],"date-time":"2024-01-24T01:00:40Z","timestamp":1706058040000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9162872\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,6]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/vlsicircuits18222.2020.9162872","relation":{},"subject":[],"published":{"date-parts":[[2020,6]]}}}