{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,18]],"date-time":"2026-03-18T06:24:36Z","timestamp":1773815076330,"version":"3.50.1"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,1,3]],"date-time":"2026-01-03T00:00:00Z","timestamp":1767398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,3]],"date-time":"2026-01-03T00:00:00Z","timestamp":1767398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,1,3]]},"DOI":"10.1109\/vlsid68508.2026.00042","type":"proceedings-article","created":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T20:19:04Z","timestamp":1773778744000},"page":"161-166","source":"Crossref","is-referenced-by-count":0,"title":["LeakAnalyser: Uncertainty-Aware Analysis of Leakage Power in Digital Circuits Under PVT Variations"],"prefix":"10.1109","author":[{"given":"Sarang","family":"Kudtarkar","sequence":"first","affiliation":[{"name":"CVEST, International Institute of Information Technology (IIIT-H),Hyderabad,India"}]},{"given":"Zia","family":"Abbas","sequence":"additional","affiliation":[{"name":"CVEST, International Institute of Information Technology (IIIT-H),Hyderabad,India"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"CMOS Digital Integrated Circuits","author":"Kang","year":"2003"},{"key":"ref2","volume-title":"Process Variation in Deep-Submicron CMOS","author":"Zjajo","year":"2016"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2013.10.013"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2017.02.002"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2002.1167566"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2010.2049059"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID60093.2024.00006"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/08839514.2021.1966885"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2760519"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS45731.2020.9180600"},{"key":"ref11","first-page":"3741","article-title":"NGBoost: Natural Gradient Boosting for Probabilistic Prediction","volume-title":"Proc. 37th Int. Conf. Mach. Learn. (ICML)","author":"Duan","year":"2020"},{"key":"ref12","article-title":"MAPIE: An Open-Source Library for Distribution-Free Uncertainty Quantification","volume-title":"Distribution-Free Uncertainty Quantification Workshop at the 39th International Conference on Machine Learning (ICML)","author":"Taquet"},{"key":"ref13","first-page":"3146","article-title":"LightGBM: A highly efficient gradient boosting decision tree","author":"Ke","year":"2017","journal-title":"Adv. Neural Inf. Process. Syst. (NeurIPS)"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/3292500.3330701"},{"key":"ref15","article-title":"unbiased boosting with categorical features","author":"Prokhorenkova","journal-title":"CatBoost:"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/2939672.2939785"},{"key":"ref17","article-title":"Enhancing lambdamart using oblivious trees","author":"Ferov","year":"2016","journal-title":"arXiv preprint arXiv"},{"key":"ref18","volume-title":"Mosfet Model - User\u2019s Manual (Technical Report)","author":"Dunga","year":"2007"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1214\/20-aos1965"}],"event":{"name":"2026 39th International Conference on VLSI Design & 25th International Conference on Embedded Systems (VLSID)","location":"Pune, India","start":{"date-parts":[[2026,1,3]]},"end":{"date-parts":[[2026,1,7]]}},"container-title":["2026 39th International Conference on VLSI Design & 25th International Conference on Embedded Systems (VLSID)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11433189\/11433171\/11433268.pdf?arnumber=11433268","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,18]],"date-time":"2026-03-18T05:31:50Z","timestamp":1773811910000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11433268\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,1,3]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/vlsid68508.2026.00042","relation":{},"subject":[],"published":{"date-parts":[[2026,1,3]]}}}