{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,18]],"date-time":"2026-03-18T06:42:39Z","timestamp":1773816159331,"version":"3.50.1"},"reference-count":24,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,1,3]],"date-time":"2026-01-03T00:00:00Z","timestamp":1767398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,3]],"date-time":"2026-01-03T00:00:00Z","timestamp":1767398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,1,3]]},"DOI":"10.1109\/vlsid68508.2026.00087","type":"proceedings-article","created":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T20:19:04Z","timestamp":1773778744000},"page":"431-436","source":"Crossref","is-referenced-by-count":0,"title":["Exploring the Resilience Nature of AlN Cap Layer in AlGaN\/GaN HEMT Under Thermal Conditions"],"prefix":"10.1109","author":[{"given":"Ellapu Bhanu","family":"Prakash","sequence":"first","affiliation":[{"name":"National Inst. of Tech. Mizoram,Dept. of ECE,Aizawl,Mizoram,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ashok","family":"Ray","sequence":"additional","affiliation":[{"name":"NERIST,Dept. of ECE,Nirjuli,Arunachal Pradesh,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sushanta","family":"Bordoloi","sequence":"additional","affiliation":[{"name":"National Inst. of Tech. Mizoram,Dept. of ECE,Aizawl,Mizoram,India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICET64964.2025.11102861"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/led.2025.3539689"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3096988"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICOEI65986.2025.11013608"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/2236\/1\/012005"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/1.369664"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1049\/pbcs073g_ch4"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s11664-019-07905-0"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2023.3260809"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3139443"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/mi15050571"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCCNT61001.2024.10724793"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/PECTEA61788.2025.11076371"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-TSA54299.2022.9771040"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1051\/epjap\/2014140019"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2012.2185921"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3057000"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2022.3150714"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/DevIC63749.2025.11012396"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2022.111756"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.micrna.2024.208054"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.rinp.2021.104768"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2024.106386"},{"key":"ref24","article-title":"Investigation of degradation mechanism in hemts device","author":"Bordoloi","year":"2022","journal-title":"Ph.D. dissertation"}],"event":{"name":"2026 39th International Conference on VLSI Design & 25th International Conference on Embedded Systems (VLSID)","location":"Pune, India","start":{"date-parts":[[2026,1,3]]},"end":{"date-parts":[[2026,1,7]]}},"container-title":["2026 39th International Conference on VLSI Design & 25th International Conference on Embedded Systems (VLSID)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11433189\/11433171\/11433235.pdf?arnumber=11433235","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,18]],"date-time":"2026-03-18T05:44:49Z","timestamp":1773812689000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11433235\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,1,3]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/vlsid68508.2026.00087","relation":{},"subject":[],"published":{"date-parts":[[2026,1,3]]}}}