{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T13:02:14Z","timestamp":1725627734482},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007,10]]},"DOI":"10.1109\/vlsisoc.2007.4402476","type":"proceedings-article","created":{"date-parts":[[2007,12,18]],"date-time":"2007-12-18T15:01:08Z","timestamp":1197990068000},"page":"78-83","source":"Crossref","is-referenced-by-count":5,"title":["Statistical analysis of systematic and random variability of flip-flop race immunity in 130nm and 90nm CMOS technologies"],"prefix":"10.1109","author":[{"given":"Gustavo","family":"Neuberger","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fernanda","family":"Kastensmidt","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ricardo","family":"Reis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gilson","family":"Wirth","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ralf","family":"Brederlow","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christian","family":"Pacha","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512645"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270854"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/4.340417"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2005.182"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/66.554480"},{"key":"ref5","first-page":"268","article-title":"A technique for fault diagnosis of defects in scan chains","author":"guo","year":"2001","journal-title":"Proc Intl Test Conf"},{"key":"ref12","first-page":"16","article-title":"Statistical metrology: understanding spatial variation in semiconductor manufacturing","author":"boning","year":"1996","journal-title":"Proc Microelectronic Manufacturing Yield Reliability and Failure Analysis II SPIE 1996 Symposium on Microelectronic Manufacturing"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1993.580048"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"192","DOI":"10.1109\/ICCD.2004.1347921","article-title":"Diagnosis of hold time defects","author":"wang","year":"2004","journal-title":"Proc IEEE Intl Conf on Computer Design (ICCD)"},{"key":"ref2","first-page":"52","article-title":"Analysis and design of low-energy flip-flops","author":"markovi\u00f3","year":"2001","journal-title":"Proc Intl Symposium on Low Power Electronics and Design (ISLPED)"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIR.2006.307544"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/383082.383094"}],"event":{"name":"2007 IFIP International Conference on Very Large Scale Integration","start":{"date-parts":[[2007,10,15]]},"location":"Atlanta, GA, USA","end":{"date-parts":[[2007,10,17]]}},"container-title":["2007 IFIP International Conference on Very Large Scale Integration"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4402461\/4402462\/04402476.pdf?arnumber=4402476","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,5]],"date-time":"2019-05-05T22:17:50Z","timestamp":1557094670000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4402476\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,10]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/vlsisoc.2007.4402476","relation":{},"subject":[],"published":{"date-parts":[[2007,10]]}}}