{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T21:36:34Z","timestamp":1725485794996},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007,10]]},"DOI":"10.1109\/vlsisoc.2007.4402499","type":"proceedings-article","created":{"date-parts":[[2007,12,18]],"date-time":"2007-12-18T15:01:08Z","timestamp":1197990068000},"page":"206-211","source":"Crossref","is-referenced-by-count":0,"title":["Qualification of behavioral level design validation for AMS & RF SoCs"],"prefix":"10.1109","author":[{"given":"Yves","family":"Joannon","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vincent","family":"Beroulle","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chantal","family":"Robach","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Smail","family":"Tedjini","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jean-Louis","family":"Carbonero","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2006.1649589"},{"journal-title":"Mentor Graphics","article-title":"CommLib RF VHD L-AMS Library","year":"2005","key":"ref11"},{"key":"ref12","first-page":"215","article-title":"Methodology for Fast and Accurate Analog Production Test Optimization","author":"khouas","year":"1999","journal-title":"Proceedings of IEEE International Mixed-Signal Test Workshop (IMSTW'99)"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/343647.343883"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/81.873869"},{"key":"ref4","first-page":"161","article-title":"Fast Hierarchical Process Variability Analysis and Parametric Test Development for Analog\/RF Circuits","author":"liu","year":"2005","journal-title":"International Conference on Computer Design (ICCD'05)"},{"key":"ref3","first-page":"115","article-title":"On code coverage measurement for Verilog-A","author":"sha","year":"2004","journal-title":"High-Level Design Validation and Test Workshop"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008317826940"},{"key":"ref5","first-page":"665","article-title":"Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models","author":"halder","year":"2003","journal-title":"IEEE ITC International Test Conference 2003"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805646"},{"key":"ref7","first-page":"45","article-title":"Mutation 2000: Uniting the Orthogonal","author":"offutt","year":"2000","journal-title":"Mutation 2000 Mutation Testing in the Twentieth and the Twenty First Centuries"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.1999.808362"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISWCS.2004.1407200"},{"key":"ref9","first-page":"119","article-title":"VHDL-AMS behavioral modeling and simulation of a Pi\/4 DQPSK transceiver system","author":"normark","year":"2004","journal-title":"IEEE International"}],"event":{"name":"2007 IFIP International Conference on Very Large Scale Integration","start":{"date-parts":[[2007,10,15]]},"location":"Atlanta, GA, USA","end":{"date-parts":[[2007,10,17]]}},"container-title":["2007 IFIP International Conference on Very Large Scale Integration"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4402461\/4402462\/04402499.pdf?arnumber=4402499","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T15:59:55Z","timestamp":1489679995000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4402499\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,10]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/vlsisoc.2007.4402499","relation":{},"subject":[],"published":{"date-parts":[[2007,10]]}}}